Large-Area Drift Detector Layout for Low-Noise Charge Collection

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current semiconductor drift detectors face challenges with low detection efficiency for energies above 20 keV and low electron mobility, leading to degraded charge collection efficiency, energy resolution, and count rate capacity, particularly due to the direct conversion nature of high-Z materials.

Innovation Solution

A large-area semiconductor drift detector using an amorphous selenium (a-Se) structure with a resistive charge division readout methodology, where drift microstrips and collecting electrodes are in separate planes to enhance charge collection and reduce electronic noise, enabling three-dimensional position sensing and simultaneous measurement of radiation energy, position, and timing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If high-Z materials are used for direct conversion of X-ray into electronic charge, then detection efficiency for high energy radiation is improved, but electron mobility is reduced leading to degraded charge collection efficiency

Engineering Contradiction:
Improvedetection efficiencyVSAvoidelectron mobility
Core Design Contradiction:
ReliabilityVSSpeed

Solution Approach 1:

The detector is segmented into two distinct functional layers: a semiconductor layer for charge generation and a drift layer for charge transport. This segmentation allows each layer to be optimized independently - the semiconductor layer for high detection efficiency and the drift layer for high electron mobility, thereby resolving the contradiction between detection efficiency and charge collection efficiency.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The detector uses a composite structure combining semiconductor material (for X-ray absorption and charge generation) with drift layer material (for efficient charge transport). This composite approach allows the system to simultaneously achieve high detection efficiency from the semiconductor and high charge collection efficiency from the drift layer, overcoming the limitation of using单一 high-Z material.

Inventive Principle:
Principle #40Composite materials

2Area of stationary object

If the detection area is increased for large-area applications, then detection coverage is improved, but electronic noise increases due to larger collecting electrode area

Engineering Contradiction:
Improvedetection areaVSAvoidelectronic noise
Core Design Contradiction:
Area of stationary objectVSObject-generated harmful factors

Solution Approach 1:

The collecting electrode is segmented into two independent parts: a drift electrode and a collecting electrode. This segmentation allows the drift electrode to be optimized for charge collection from the large detection area while the collecting electrode can be optimized for low noise readout, thereby maintaining large detection area without proportionally increasing electronic noise.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The drift layer acts as an intermediary between the large-area semiconductor layer and the collecting electrode. It transports charges from the large detection area to the collecting electrode, allowing the collecting electrode area to be smaller than the detection area, thus reducing electronic noise while maintaining large detection coverage.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If segmented readout electrodes are used to achieve two-dimensional position sensitivity, then position resolution is improved, but device complexity increases

Engineering Contradiction:
Improveposition sensitivityVSAvoidreadout electrode structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent achieves two-dimensional position sensitivity by utilizing the drift time dimension in addition to the spatial dimension. Charges drift through the drift layer and their arrival time at the collecting electrode provides the second position coordinate, eliminating the need for complex segmented readout electrodes while maintaining position sensitivity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The drift layer structure itself provides the position encoding function through the drift time of charges. Instead of requiring external segmented readout electrodes to determine position, the system uses the inherent drift characteristics of the drift layer to encode position information in the charge arrival time, simplifying the overall device structure.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution improves spatial resolution, energy resolution, and count rate capacity by minimizing the impact of slow charge carriers and reducing electronic noise, while allowing for cost-effective detection of higher energy radiation with reduced complexity in readout electronics.

Implementation Method 1

the set of drift microstrips shape an electric field and direct charges within the drift detector towards the set of collecting electrodes

Methodology Applied
Scientific EffectElectric field: Electric Field

Implementation Method 2

These materials are direct converters of X-ray into electronic charge

Methodology Applied
Scientific EffectDirect conversion: Photoelectric Effect

Implementation Method 3

the charge induced by an absorbed photon is divided along with the resistive layer or strip depending on the photon absorption location

Methodology Applied
Scientific EffectResistive charge division: Electrical Resistance

Data Source

PatentUS20240210579A1Large-area semiconductor drift detector for radiation detection
Publication Date: 2024.06.27 ADNANI SAHAR
  • US20240210579A1 patent drawing
  • US20240210579A1 patent drawing
  • US20240210579A1 patent drawing

AI summary

The disclosure is directed at a large-area semiconductor drift detector that includes a set a substrate layer; a semiconductor layer; a set of drift microstrips positioned between the substrate layer and the semiconductor layer; and a set of collecting electrodes positioned between the substrate layer and the semiconductor layer and in a different plane than the set of drift microstrips; wherein the set of drift microstrips shape an electric field and direct charges within the drift detector towards the set of collecting electrodes.