Driver Channel Off-State Diagnosis with a Shared Timing Counter
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Solution Overview
Problem
Existing integrated circuits with off-state diagnosis circuitry consume a large amount of area due to dedicated fault detection systems for driver channels, limiting the available space for other functions.
Innovation Solution
A shared counter provides timing windows for off-state diagnosis to all driver channels, allowing simultaneous fault detection with minimal circuit area usage, and includes analog test circuits and controllers for each channel to perform efficient fault detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If dedicated off-state diagnosis circuitry is implemented for each driver channel, then fault detection capability is improved, but integrated circuit area consumption increases
Solution Approach 1:
Multiple driver channels share a single off-state diagnosis circuit and counter resource, merging what would otherwise be separate dedicated circuits for each channel. This sharing approach maintains fault detection capability across all channels while significantly reducing the total area consumed by diagnosis circuitry.
Solution Approach 2:
The off-state diagnosis circuit and counter are designed as universal resources that can serve multiple driver channels simultaneously. The same diagnosis circuit can diagnose different channels at different times, and the counter provides timing windows for multiple channels, making the system multi-functional rather than requiring dedicated single-purpose circuits for each channel.
2Productivity
If simultaneous off-state diagnosis is performed for all driver channels, then diagnostic speed is improved, but circuit complexity increases
Solution Approach 1:
The counter generates periodic timing windows that enable sequential activation of diagnosis circuits for different driver channels. By organizing diagnosis operations in periodic time slots assigned to different channels, the system achieves efficient multi-channel diagnosis without requiring all diagnosis circuits to operate simultaneously, thus controlling complexity.
Solution Approach 2:
The system dynamically allocates the shared diagnosis circuit and counter resources to different driver channels based on timing signals. The diagnosis circuit is activated for specific channels during specific time windows, creating a dynamic time-division multiplexing scheme that enables fast diagnosis across all channels while maintaining manageable circuit complexity through controlled resource sharing.
Data Source
AI summary
An integrated circuit includes a plurality of power transistor driver channels for driving external loads. The driver channels can be selectively configured as high side or low side driver channels. The integrated circuit includes, for each driver channel, a respective analog test circuit and a respective controller. The integrated circuit includes a single counter connected to each of the controllers for simultaneously controlling off-state diagnosis timing windows for the driver channels.


