Driver Chip State Self-Test Against EMI Data Corruption
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Solution Overview
Problem
The issue with existing display technologies is that data in the internal registers of driver chips is disordered, leading to poor display quality due to electromagnetic interference, which cannot be detected by the driver chips.
Innovation Solution
A state self-test method for driver chips that includes initializing first-type registers, calculating a checked value based on actual register values, and comparing it with an auxiliary check value to determine if the operating state is abnormal, allowing timely detection and correction of disordered data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If driver chip uses internal registers to store display data, then display function is achieved, but data becomes disordered due to electromagnetic interference affecting display quality
Solution Approach 1:
The patent implements a feedback mechanism where the driver chip calculates a checked value from actual register values and compares it with a pre-stored auxiliary check value. This feedback loop enables the system to detect data anomalies caused by electromagnetic interference, allowing timely detection and correction of register data disorders to maintain display quality.
Solution Approach 2:
The patent applies preliminary action by pre-storing the auxiliary check value in the register before electromagnetic interference can occur. This advance preparation allows the system to detect data corruption when it happens, as the original correct value is already available for comparison with the corrupted register data.
2Reliability
If driver chip performs self-test to detect data anomalies, then display quality improves, but additional test steps increase processing time
Solution Approach 1:
The driver chip performs self-testing using its own internal resources - the chip calculates the checked value from its register values and compares with the auxiliary check value stored within the same chip. This self-service approach eliminates the need for external testing equipment and minimizes processing time by using the chip's own computational capabilities for verification.
Solution Approach 2:
The auxiliary check value is prepared in advance and stored in the register before actual data processing occurs. This preliminary action allows the self-test to be performed quickly without requiring complex real-time calculations, as the comparison can be made directly with the pre-stored reference value.
Data Source
AI summary
Embodiments of the present application disclose a driver chip, and a state self-test method therefor. Initialization of first-type registers is performed based on a received initialization instruction, and an auxiliary check value is received. When a state self-test instruction is received, a checked value is calculated based on actual register values of the first-type registers, and whether an operating state of the driver chip is abnormal is determined by determining whether a relationship between the checked value and the auxiliary check value meets a preset condition.