Droplet Luminance Measurement for Particle Concentration Control

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Solution Overview

Problem

Existing display manufacturing processes face challenges in accurately measuring and controlling the concentration of particles in droplets, which affects the uniformity and quality of layers formed on display substrates, particularly in forming color filters and emission layers with quantum dots.

Innovation Solution

A method and apparatus that measure the luminance of droplets on a test table or substrate to calculate the concentration of particles, using a correction luminance approach to ensure uniform particle distribution across the substrate, allowing for precise control of droplet ejection and formation of uniform layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If droplet concentration is measured using conventional methods, then measurement process is simple, but measurement precision is insufficient to accurately determine particle concentration

Engineering Contradiction:
Improveparticle concentration measurement precisionVSAvoidmeasurement apparatus complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces conventional mechanical or chemical measurement methods with an optical measurement system. The image capturing device records luminance data from droplets on the test table, and the controller processes this optical information to calculate particle concentration. This substitution of optical fields for mechanical/chemical measurement methods achieves high precision while maintaining relatively simple device structure.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces luminance as an intermediary parameter to measure particle concentration. Instead of directly measuring particle concentration, the system measures the luminance of droplets (which is affected by particle concentration) and then calculates the concentration from this intermediate measurement. This intermediary approach enables indirect but accurate measurement of the target parameter.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Manufacturing precision

If droplet ejection is performed without concentration control, then manufacturing process is fast, but manufacturing precision of layer uniformity deteriorates

Engineering Contradiction:
Improvelayer uniformityVSAvoidmanufacturing speed
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent implements a feedback control system where droplets are first ejected onto a test table, their luminance (and thus particle concentration) is measured, and this measurement feedback is used to control subsequent droplet ejection onto the actual substrate. The controller adjusts ejection parameters based on the measured concentration data, ensuring uniform layer formation while maintaining efficient production throughput.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent performs preliminary measurement of droplet concentration on a test table before actual deposition onto the display substrate. This preliminary action allows the system to verify droplet quality and make necessary adjustments before the actual manufacturing step, ensuring high precision without requiring slow, incremental deposition processes.

Inventive Principle:
Principle #10Preliminary action

3Manufacturing precision

If multiple nozzles with different concentrations are used, then layer uniformity can be improved, but device complexity increases

Engineering Contradiction:
Improvelayer uniformityVSAvoidejector system complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent utilizes parameter changes in the existing multi-nozzle ejector system, specifically varying the particle concentration parameter of droplets from different nozzles. Rather than adding complex new components, the system leverages the existing nozzle array and controls droplet formulation parameters to achieve uniform layer deposition across the substrate.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables accurate measurement and control of particle concentrations, ensuring uniformity and quality of layers, thereby improving the display's color purity and optical viewing angle.

Implementation Method 1

calculating a first luminance of a first area of the plane, the first area including a planar area of the droplet

Methodology Applied
Scientific EffectLuminance measurement:

Implementation Method 2

calculating a concentration of particles contained in the droplet based on a correction luminance obtained by dividing the first luminance by the second luminance

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentUS20230012042A1Apparatus for manufacturing display apparatus, method of measuring droplet, and method of manufacturing display apparatus
Publication Date: 2023.01.12 SAMSUNG DISPLAY CO LTD
  • US20230012042A1 patent drawing
  • US20230012042A1 patent drawing
  • US20230012042A1 patent drawing

AI summary

A method of manufacturing a display apparatus, the method includes supplying, from an ejector, a droplet onto a plane, capturing an image of the droplet, calculating a first luminance of a first area of the plane, the first area including a planar area of the droplet, and calculating a concentration of particles contained in the droplet based on the first luminance.