Photosensitive Dry Film Composition for Fine Thick-Film Patterning

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Solution Overview

Problem

Existing photosensitive resin compositions used for semiconductor chips and multilayer printed circuit boards have limitations in resolution and substrate adhesion, particularly when forming fine patterns in thick film forms.

Innovation Solution

A photosensitive resin composition comprising a polymer with silphenylene and fluorene skeletons, an epoxy compound with multiple epoxy groups, a photoacid generator, and benzotriazole or imidazole compounds, along with an organic solvent, which enables high resolution and strong adhesion to substrates.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a photosensitive silicone composition based on silphenylene structure-containing silicone type polymer is used, then film properties are improved, but resolution deteriorates

Engineering Contradiction:
Improvefilm propertiesVSAvoidresolution
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent uses a composite polymer structure combining silphenylene units (for flexibility and film properties) with fluorene units (for high resolution and crosslinking capability). This composite approach allows simultaneous achievement of good film properties and high resolution by integrating the advantages of different molecular structures in a single polymer system.

Inventive Principle:
Principle #40Composite materials

2Ease of manufacture

If conventional photosensitive resin compositions are used, then processing is simplified, but adhesion to substrate deteriorates

Engineering Contradiction:
ImproveprocessingVSAvoidadhesion to substrate
Core Design Contradiction:
Ease of manufactureVSStrength

Solution Approach 1:

The patent modifies the chemical composition parameters of the photosensitive resin by incorporating specific functional groups (epoxy groups, carboxyl groups, hydroxyl groups) in controlled amounts. These parameter changes enhance substrate adhesion through chemical bonding while maintaining ease of processing through standard photolithography procedures.

Inventive Principle:
Principle #35Parameter changes

3Volume of moving object

If thick film form is used, then coverage is improved, but pattern fineness deteriorates

Engineering Contradiction:
Improvefilm thicknessVSAvoidpattern fineness
Core Design Contradiction:
Volume of moving objectVSManufacturing precision

Solution Approach 1:

The patent incorporates crosslinking groups and reactive sites in the polymer structure before the actual patterning process. This preliminary preparation of the molecular structure enables the thick film to maintain its shape and resist diffusion during development, allowing fine patterns to be formed even in thick film form through the pre-established molecular network.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The composition allows for the formation of fine size patterns with perpendicular profiles even in thick films, demonstrating improved film properties and processing capabilities.

Implementation Method 1

a photoacid generator

Methodology Applied
Scientific EffectPhotoacid generation: Photopolymerisation

Implementation Method 2

an epoxy compound containing on the average at least four epoxy groups per molecule

Methodology Applied
Scientific EffectCrosslinking reaction: Chemical Bonding

Data Source

PatentUS12493244B2Photosensitive resin composition, photosensitive dry film, and pattern formation method
Publication Date: 2025.12.09 SHIN ETSU CHEMICAL CO LTD
  • US12493244B2 patent drawing
  • US12493244B2 patent drawing
  • US12493244B2 patent drawing

AI summary

Provided is a photosensitive resin composition which comprises (A) a polymer comprising repeating units represented by formula (A1) and at least one kind of repeating units selected from among repeating units represented by formula (A2) and repeating units represented by formula (A3), (B) an epoxy compound containing four or more epoxy groups on average in the molecule, (C) a photoacid generator, (D) a benzotriazole compound and/or an imidazole compound, and (E) an organic solvent.