DSD Tester Segmentation for Defect Detection Accuracy
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Solution Overview
Problem
Existing data storage device (DSD) testing methods, such as drive self tests, are inadequate for accurately detecting defects, leading to defective DSDs being installed in OEM products, resulting in costly field failures and unnecessary returns.
Innovation Solution
A DSD tester with control circuitry that executes comprehensive tests, aggregates failure data with production line data, and correlates it to identify and correct manufacturing or production line issues, using a graphical user interface and barcode readers to facilitate the testing and data analysis process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If drive self test (DST) is used for testing DSDs, then testing speed is improved, but measurement precision deteriorates leading to inaccurate defect detection
Solution Approach 1:
The testing system is segmented into multiple specialized test stations (read channel test station, write channel test station, servo test station, format and integrity test station) that perform specific comprehensive tests on different aspects of the DSD, replacing the single rudimentary DST with coordinated specialized testing
Solution Approach 2:
A manufacturer log and multiple test stations act as intermediaries between the DSD and the testing system, capturing detailed operational data and enabling comprehensive analysis that goes beyond the limited DST capabilities while maintaining efficient testing throughput
2Measurement precision
If comprehensive tests are performed on DSDs, then measurement precision is improved for accurate defect detection, but device complexity increases
Solution Approach 1:
The complex testing system is divided into separate functional test stations, each handling a specific type of test (read channel, write channel, servo, format), which reduces the complexity burden on any single component while achieving comprehensive testing through coordination of multiple specialized units
Solution Approach 2:
The DSD's own control circuitry and logs are utilized to support the comprehensive testing process, with the drive self test (DST) and manufacturing logs providing baseline data that complements the external comprehensive testing, reducing the need for entirely external testing infrastructure
3Ease of operation
If drive self test (DST) is used, then ease of operation is improved, but reliability deteriorates resulting in defective DSDs being installed
Solution Approach 1:
The system implements feedback mechanisms where test results from multiple specialized stations are aggregated and analyzed to make informed decisions about DSD quality, with manufacturer logs providing additional feedback loops that track DSD performance throughout the testing process and enable continuous quality improvement
Solution Approach 2:
By segmenting the testing into multiple specialized stations, each station can be optimized for its specific function while maintaining ease of operation through standardized interfaces, and the collective output provides reliable quality assurance that surpasses the limitations of a single simplified test
Data Source
AI summary
A data storage device (DSD) tester is disclosed for testing a DSD. The DSD tester comprises control circuitry operable to receive production line data through an interface, wherein the production line data is related to the DSD. The control circuitry executes a DSD test on the DSD, and transmits failure data generated by the DSD test and the production line data to a failure information database.