Distance-to-fault probe with multi-port scattering matrix
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Solution Overview
Problem
Conventional vector network analyzers are expensive, bulky, and heavy, making them unsuitable for cost-effective and low-bulk distance-to-fault (DTF) measurement systems that require accurate measurement of complex reflection coefficients in single-port RF and microwave devices.
Innovation Solution
A method and system for computing complex reflection coefficients using a DTF system with a probe that performs alignment and calibration, utilizing a multi-port measurement circuit with a 4x4 scattering matrix to account for detector reflection coefficients, and employing analog-to-digital converters to record voltages from alignment standards, allowing for accurate computation of complex reflection coefficients.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a vector network analyzer is used to measure complex reflection coefficients, then measurement accuracy is improved, but device cost and bulk increase
Solution Approach 1:
The patent extracts the essential measurement functionality from a complete vector network analyzer by using a simplified probe-based DTF system that only performs the specific function of measuring complex reflection coefficients for fault location, eliminating unnecessary features and reducing overall system complexity and cost
Solution Approach 2:
The patent changes the measurement parameters by working in the time domain through inverse Fourier transformation of frequency domain measurements, and by using calibrated probe scattering parameters to convert voltage measurements into complex reflection coefficients, achieving VNA-level accuracy with simpler equipment
2Measurement precision
If probe scattering parameters are accounted for in the measurement model, then measurement accuracy is improved, but computational complexity increases
Solution Approach 1:
The patent performs preliminary calibration measurements to determine the probe's scattering parameters before actual measurements, storing these parameters for use in the measurement equations. This preliminary action separates the complex characterization step from the routine measurement process, making the actual measurements computationally efficient
Solution Approach 2:
The patent introduces calibrated scattering parameters as intermediary values that bridge the simple voltage measurements from the probe and the desired complex reflection coefficients. These pre-computed parameters act as mediators in the measurement equations, simplifying the real-time computation while maintaining accuracy
Data Source
AI summary
Techniques are disclosed for computing distance-to-fault (DTF) in communication systems. The techniques can be embodied, for instance, in a DTF system that provides a multi-port probing device and DTF functionality, including computing distances to faults and the fault magnitudes. In addition, the DTF system is further configured with the ability to accurately measure complex reflection coefficient of the UUT, and/or return loss of the UUT. The complex reflection coefficient and/or return loss of the UUT can be computed as a function of known scattering parameters of a multi-port measurement circuit included in the probe of the DTF system.