Dual-ADC Reference Voltage Correction for Gain Error Calibration
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Solution Overview
Problem
Existing semiconductor devices face challenges in accurately correcting AD conversion gain errors due to manufacturing variations and power supply voltage fluctuations, which affect the dynamic range and accuracy of signal processing.
Innovation Solution
A semiconductor device configuration that includes a voltage generator using passive elements to generate reference voltages, allowing for accurate correction of AD conversion errors by calculating and applying correction values based on the ratio between different digital values obtained from multiple AD converters.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Temperature
If multiple AD converters are used to extend dynamic range, then the dynamic range is improved, but manufacturing variations cause gain errors that reduce measurement precision
Solution Approach 1:
The patent implements a feedback mechanism where the correction value calculation circuit uses the actual digital values from multiple AD converters to compute correction values, which are then fed back to correct gain errors in subsequent conversions. This closed-loop approach compensates for manufacturing variations and improves measurement precision while maintaining extended dynamic range.
Solution Approach 2:
The patent changes the parameter of reference voltage by generating multiple reference voltages with different gain values using a voltage generator. By varying the reference voltage parameters and comparing the resulting digital values, the system calculates correction values that compensate for manufacturing variations, thereby improving measurement precision without sacrificing dynamic range extension.
2Measurement precision
If correction values are calculated using multiple AD converters, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent applies multi-functionality by designing the correction value calculation circuit to perform multiple tasks: it calculates correction values for gain errors, generates corrected digital values, and provides correction data to other circuits. This universal approach improves measurement precision without proportionally increasing device complexity, as the same circuit structure serves multiple purposes in the AD conversion system.
3Manufacturing precision
If a voltage generator with passive elements is used to generate reference voltages, then manufacturing variations are reduced, but the circuit requires additional components
Solution Approach 1:
The patent uses a voltage generator that creates multiple reference voltages by copying and scaling a base reference voltage through passive resistive dividers. This copying approach ensures that all reference voltages maintain consistent ratios despite manufacturing variations, improving voltage generation consistency. The passive element-based copying mechanism reduces sensitivity to component tolerances while adding minimal circuit complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration effectively reduces the impact of AD conversion errors and manufacturing variations, improving the accuracy and dynamic range of signal processing in semiconductor devices.
Implementation Method 1
the voltage generator generates voltages by dividing a power supply voltage by resistive elements
Data Source
AI summary
A semiconductor device comprising: a voltage generator configured to generate a voltage; a first analog-to-digital (AD) converter configured to convert an analog value based on a voltage generated by the voltage generator into a first digital value; and a second AD converter configured to convert an analog value based on a voltage generated by the voltage generator into a second digital value, wherein the voltage generator generates voltages by dividing a power supply voltage by resistive elements.