Dual-Array Material Imaging for Reflection and Transmission Analysis

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing imaging systems for material characterization, such as those used for radomes, are limited by their ability to perform only transmission measurements, leading to inaccurate and inefficient characterization.

Innovation Solution

An imaging system comprising at least two imaging arrays configured to form pairs, capable of performing both reflection and transmission measurements, and determining material characteristics based on these measurements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If only transmission measurement is performed, then the measurement process is simple, but the material characterization accuracy is insufficient

Engineering Contradiction:
Improvematerial characterization accuracyVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The imaging array is designed to perform multiple measurement functions (transmission and reflection measurements) using the same hardware configuration. This allows the system to achieve comprehensive material characterization with a single versatile device, resolving the contradiction between measurement accuracy and device complexity by making the measurement system multi-functional rather than requiring separate specialized devices for each measurement type

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Productivity

If only transmission measurement is performed, then the device configuration is simple, but the material characterization efficiency is low

Engineering Contradiction:
Improvematerial characterization efficiencyVSAvoidimaging system configuration
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The imaging array configuration enables both transmission and reflection measurements to be performed with the same device setup. This multi-functionality allows the system to efficiently characterize multiple material properties without requiring complex reconfiguration or multiple separate devices, thereby improving productivity while maintaining manageable device complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system can perform transmission and reflection measurements in a continuous manner using the same imaging array without requiring intermediate reconfiguration steps. This continuous measurement capability improves characterization efficiency by eliminating downtime and resetup procedures, allowing comprehensive material analysis to be completed in a single operational sequence

Inventive Principle:
Principle #20Continuity of useful action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Ensures high accuracy and efficiency in material characterization by enabling both reflection and transmission measurements, providing comprehensive information about the sample's material properties.

Implementation Method 1

Each of the at least two imaging arrays 12a, 12b comprises a monostatic or multistatic array

Methodology Applied
Scientific EffectElectromagnetic radiation: Electromagnetic Induction

Data Source

PatentEP3968045B1Imaging system and method for material characterization of a sample
Publication Date: 2025.06.04 ROHDE & SCHWARZ GMBH & CO KG
  • EP3968045B1 patent drawingFigure 1
  • EP3968045B1 patent drawingFigure 2
  • EP3968045B1 patent drawingFigure 3

AI summary

An imaging system (10) for material characterization of a sample (11) is provided. Said imaging system (10) comprises at least two imaging arrays (12a, 12b) configured to form at least one imaging array pair. In this context, the imaging system (10) is configured to perform at least one reflection measurement (13a, 13b) with the aid of at least one imaging array (12a, 12b). Furthermore, the imaging system (10) is configured to perform at least one transmission measurement (14a, 14b) with the aid of the at least one imaging array pair. In addition to this, the imaging system (10) is configured to determine material characteristics of the sample (11) on the basis of the at least one reflection measurement (13a, 13b) and/or the at least one transmission measurement (14a, 14b).