Dual-Axis Specimen Measurement for Automated Material Testing
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Solution Overview
Problem
Conventional material testing systems face limitations in efficiently and accurately measuring specimen dimensions and properties, particularly in automated setups, which can affect the precision and reliability of material testing results.
Innovation Solution
The introduction of an automatic test specimen measurement apparatus with dual measurement assemblies, each comprising an anvil, micrometer, and actuators, allowing simultaneous movement and contact with the specimen to measure dimensions in multiple directions, along with a robotic manipulator for specimen positioning and a control system to determine and adjust measurements based on nominal dimensions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If manual measurement methods are used, then measurement precision can be maintained, but productivity and automation level are reduced
Solution Approach 1:
The measurement apparatus performs self-alignment and self-measurement through automated actuators that position the anvil and micrometer without manual intervention. The system automatically adjusts to specimen positions and executes measurements based on programmed parameters, eliminating the need for manual alignment and measurement operations.
Solution Approach 2:
Manual mechanical measurement operations are replaced with an automated measurement system comprising electric actuators, micrometers, and anvils controlled by a computer. The automated system substitutes human hands and eyes with mechanical and electronic components that perform positioning, alignment, and measurement functions.
2Measurement precision
If single-direction measurement assemblies are used, then device complexity is reduced, but measurement precision and completeness are insufficient
Solution Approach 1:
The measurement apparatus is divided into separate functional modules: a first measurement assembly for measuring a first dimension and a second measurement assembly for measuring a second dimension. Each assembly operates independently with its own anvil, micrometer, and actuator, allowing specialized optimization of each measurement function while maintaining overall system organization.
Solution Approach 2:
The system transitions from single-direction measurement to multi-directional measurement by incorporating measurement assemblies that operate in different dimensional orientations. The first and second measurement assemblies measure dimensions in different directions, enabling comprehensive dimensional characterization of the specimen.
3Productivity
If automated measurement is implemented, then productivity is improved, but measurement precision may be compromised due to automation limitations
Solution Approach 1:
The automated measurement system incorporates feedback mechanisms where the control system monitors measurement results and adjusts subsequent measurements based on previous outcomes. The system can detect measurement variations and automatically modify positioning or measurement parameters to maintain precision despite automated operation.
Solution Approach 2:
The system performs preliminary alignment and positioning actions before actual measurement takes place. The actuators pre-position the anvil and micrometer at the correct locations and orientations, ensuring that when measurement occurs, the system is already in the optimal state for precise measurement, thereby maintaining accuracy through preparatory automated actions.
Data Source
AI summary
Disclosed example test specimen measurement apparatus include: a first measurement assembly configured to measure a first specimen dimension in a first direction, the first measurement assembly comprising: a first anvil oriented along the first direction; a first micrometer oriented along the first direction and configured to output a first measurement; a first actuator configured to actuate the first micrometer with respect to the first anvil; and a second actuator configured to actuate the first micrometer and the first anvil simultaneously along the first direction; and a second measurement assembly configured to measure a second specimen dimension in a second direction, the second measurement assembly comprising: a second anvil oriented along the second direction; a second micrometer oriented along the second dimension and configured to output a second measurement; and a third actuator configured to actuate the second micrometer with respect to the second anvil.