Dual-band filter array for multi-peak wavelength sensing
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Solution Overview
Problem
Conventional spectrum meters face complexity in manufacturing due to variations in filter thickness and are limited in capturing 2D images, especially when trying to allow multiple narrow wavebands to pass through, restricting their applications.
Innovation Solution
A spectrum-inspection device with a sensor unit array and dual-band pass filters that allow specific wavebands to pass through, using high pass filters to further refine the wavelengths captured by each sensor unit, enabling the separation of multiple wavebands with a simpler manufacturing process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If narrow waveband pass filters of different thickness are disposed on sensor units to measure different wavebands, then measurement precision is improved, but device complexity increases due to variations in filter thickness making the manufacturing process more complicated
Solution Approach 1:
The patent applies local quality by using a single uniform thickness filter layer that is positioned at different locations (angles) relative to the sensor units. Instead of varying the filter thickness across different sensors, the invention keeps the filter thickness constant and achieves different waveband measurements by adjusting the angular position of each sensor unit relative to the filter layer, thereby simplifying manufacturing while maintaining measurement precision
Solution Approach 2:
The patent changes the parameter from filter thickness to angular position. Rather than using filters of different thicknesses to achieve different waveband measurements, the invention maintains a single filter thickness and varies the measurement outcomes by changing the angular position of sensor units relative to the filter layer, thus resolving the manufacturing complexity issue
2Measurement precision
If the filter layer is arranged as a wedged pattern to vary thickness, then waveband separation is improved, but adaptability decreases because the spectrum meter can only measure linear spectrum and cannot capture 2D image
Solution Approach 1:
The patent achieves multi-functionality by using a uniform thickness filter layer combined with angularly positioned sensor units. This configuration allows the spectrum meter to perform both linear spectrum measurement and 2D image capture, making the device versatile for multiple applications rather than limited to a single function
Solution Approach 2:
The patent introduces angular position as an additional dimension for waveband separation instead of relying solely on filter thickness variation. By positioning sensor units at different angles relative to the uniform filter layer, the invention enables both spectral measurement and spatial imaging capabilities
3Measurement precision
If multi-film interference filter is used to allow four narrow wavebands to pass through, then measurement precision is improved, but ease of manufacture deteriorates as it is very difficult to coat such a multi-film layer
Solution Approach 1:
The patent extracts the complexity from the filter layer by using a single uniform thickness filter instead of a complex multi-film interference filter. The waveband separation function is achieved not by complex filter structures but by the angular positioning of sensor units, thereby simplifying the manufacturing process while maintaining measurement precision
Solution Approach 2:
The patent uses a simplified filter structure that can be easily manufactured and replicated. Instead of difficult-to-coat multi-film layers, the invention employs a single uniform filter layer that is much easier to manufacture and reproduce, reducing manufacturing difficulty while achieving the same waveband separation through angular positioning
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for the efficient separation of multiple wavebands with reduced manufacturing complexity, enabling the device to capture 2D images and expand its application beyond single-purpose use.
Implementation Method 1
a dual-band pass filter disposed on the sensor unit array to cover the first sensor unit and the second sensor unit, wherein the dual-band pass filter allows a first waveband and a second waveband of a light beam to pass through
Implementation Method 2
a filter disposed on the dual-band pass filter to cover the second sensor unit, wherein the filter allows wavelengths of a light beam longer than a first wavelength to pass through
Implementation Method 3
The sensor unit array includes a first sensor unit and a second sensor unit... the first sensor unit generates a first strength value and the second sensor unit generates a second strength value
Data Source
AI summary
A spectrum-inspection device includes: a sensor unit array including a first sensor unit and a second sensor unit; a dual-band pass filter disposed on the sensor unit array to cover the first sensor unit and the second sensor unit, wherein the dual-band pass filter allows a first waveband and a second waveband of a light beam to pass through; and a filter disposed on the dual-band pass filter to cover the second sensor unit, wherein the filter allows wavelengths of a light beam longer than a first wavelength to pass through, wherein the first wavelength is longer than a peak wavelength of the first waveband and shorter than a peak wavelength of the second waveband.