Dual Beam Assembly for Chromatic Confocal Sensor
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Solution Overview
Problem
Current chromatic confocal point sensors are limited in their ability to measure multiple points and ranges simultaneously, requiring physical movement of the sensor or the use of costly and bulky interferometers for certain measurements.
Innovation Solution
A dual beam assembly is attached to the chromatic confocal point sensor, which divides the source beam into two measurement beams with adjustable orientations and ranges, allowing for simultaneous measurement of multiple points and ranges without the need for physical movement, using a pattern of reflective and transmissive regions to minimize aberrations and optimize signal strength.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a single chromatic confocal point sensor is used, then the device complexity is low, but the ability to measure multiple points and ranges simultaneously is limited
Solution Approach 1:
The patent divides the single measurement beam into multiple separate measurement beams using beam splitting optics. Each beam can be directed to different measurement points or ranges, enabling simultaneous multi-point measurement while maintaining a relatively simple overall device structure
Solution Approach 2:
The patent creates a multi-functional measurement system where a single optical pen can perform multiple measurement functions (different points, different ranges) through the integrated beam splitting assembly, eliminating the need for multiple separate sensors or complex mechanical movement systems
2Adaptability or versatility
If physical movement of the sensor is used to measure multiple points, then the measurement versatility improves, but the measurement speed decreases
Solution Approach 1:
The patent replaces mechanical movement systems with optical beam splitting and steering mechanisms. Multiple measurement beams are generated and directed simultaneously to different points through optical elements rather than physically moving the sensor, enabling parallel measurement operations that significantly increase measurement speed while maintaining versatility
3Measurement precision
If interferometers are used for certain measurements, then the measurement precision improves, but the device complexity and cost increase
Solution Approach 1:
The patent extracts and integrates only the essential beam splitting and directing functions into a compact assembly that works with the existing chromatic confocal point sensor. This avoids the need for complete interferometer systems while achieving the necessary measurement precision through selective optical element integration
4Adaptability or versatility
If beam splitting optics are added to create multiple measurement beams, then the measurement versatility improves, but the signal throughput may decrease
Solution Approach 1:
The patent optimizes the beam splitting optics to distribute light efficiently among multiple beams, with each beam receiving adequate signal strength for its specific measurement task. The optical elements are designed and positioned to minimize losses at each beam split point, ensuring that local signal quality is maintained across all measurement channels
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables faster and more accurate measurements of multiple points and ranges with a single optical pen, reducing the need for physical movement and eliminating the use of costly interferometers, while maintaining high signal throughput and resolution.
Implementation Method 1
a first reflective element is attached to the mounting element. The first reflective element is positioned in the source beam from the optical pen and divides the source beam into a first measurement beam and a second measurement beam
Data Source
AI summary
A dual beam assembly is provided for attachment to a chromatic confocal point sensor optical pen. The optical pen provides a single source beam having a measurement range R in the absence of the dual beam assembly. The dual beam assembly includes a first reflective element that is positioned in the source beam and divides it into a first measurement beam and a second measurement beam. The dual beam assembly outputs the first and second measurement beams along first and second measurement axes to different workpiece regions and returns workpiece measurement light arising from the first and second measurement beams back to the optical pen. A second reflective element may be included and configured to deflect the second measurement beam along a desired direction. An offset may be provided between the measuring ranges of the first and second measurement beams.


