Dual-Carrier Test Socket Handling for Faster Electronic Device Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional electronic device testing apparatuses face inefficiencies due to frequent reciprocal movement of a single carrier platform, leading to errors in pick-and-place positions, prolonged test suspending times, and inadequate spatial layout and capacity for loading and unloading devices.
Innovation Solution
The apparatus employs separate input and output carriers synchronized with a pressing head to transfer electronic devices between feeding, testing, and discharging zones, eliminating unnecessary movements and optimizing spatial layout for improved efficiency and capacity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single carrier platform is used to transfer both electronic devices to be tested and tested electronic devices, then the device complexity is reduced, but the test efficiency deteriorates due to frequent reciprocation and position errors
Solution Approach 1:
The single carrier platform is segmented into two independent carriers: a first carrier for transferring electronic devices to be tested and a second carrier for transferring tested electronic devices. This segmentation eliminates the need for a single carrier to perform multiple functions, thereby reducing frequent reciprocation and position errors while maintaining structural simplicity through modular design.
Solution Approach 2:
The function of the second carrier is extracted and separated from the first carrier. The second carrier is specifically dedicated to transferring tested electronic devices to the receiving device, while the first carrier handles electronic devices to be tested. This extraction eliminates interference between different transfer functions and improves overall test efficiency.
2Device complexity
If a single carrier platform reciprocates frequently to transfer devices, then the device complexity is reduced, but the test suspending time increases
Solution Approach 1:
The carrier system is segmented into specialized carriers that operate independently. The first carrier handles incoming devices while the second carrier handles outgoing tested devices, allowing simultaneous operations without waiting for a single carrier to complete its reciprocating cycle, thereby reducing test suspending time.
Solution Approach 2:
With separate carriers operating independently, the transfer process achieves continuity. While the first carrier is transferring electronic devices to be tested, the second carrier can simultaneously transfer tested electronic devices, eliminating idle waiting time and continuous suspending time associated with a single carrier's reciprocation cycle.
3Ease of operation
If the carrier platform moves reciprocatedly to transfer devices, then the transferring function is achieved, but the pick-and-place position accuracy deteriorates
Solution Approach 1:
The reciprocating carrier platform is segmented into two carriers with dedicated functions. The first carrier moves electronic devices to be tested from the feeding device to the test socket, while the second carrier moves tested electronic devices from the test socket to the receiving device. This segmentation allows each carrier to maintain consistent movement patterns and positioning accuracy for its specific transfer function.
Solution Approach 2:
The position accuracy requirement is extracted and applied separately to each carrier's specific transfer function. The first carrier is optimized for positioning electronic devices to be tested, while the second carrier is optimized for positioning tested electronic devices, thereby maintaining high pick-and-place position accuracy for each function without the interference of a single carrier performing multiple functions.
4Productivity
If the spatial layout is optimized with separate input and output carriers, then the test efficiency is improved, but the device complexity increases
Solution Approach 1:
The carrier system is segmented into functionally independent first and second carriers, each with dedicated transfer paths. This segmentation improves test efficiency by eliminating interference between different transfer operations while maintaining manageable complexity through modular, standardized carrier designs that can be independently manufactured and maintained.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution significantly reduces test suspending times, enhances transfer efficiency, and extends the service life of the apparatus by simplifying operations and reducing energy consumption while providing a more efficient and capable testing environment.
Implementation Method 1
The pressing head (41) includes a suction nozzle (411) for picking or placing the electronic device to be tested
Data Source
AI summary
The present invention relates to an electronic device testing apparatus and a testing method thereof. When the test is completed, a pressing head picks up a tested electronic device from a test socket and places the tested electronic device on an output carrier, the output carrier moves out of a test zone, and an input carrier follows immediately after the output carrier and successively moves into the test zone at the same speed; after the pressing head picks up an electronic device to be tested from the input carrier, the input carrier moves out of the test zone, and the pressing head places the electronic device to be tested in the test socket. Accordingly, in the present invention, the operation of the pressing head is simplified, and the overall test efficiency is improved.