Dual-Chamber Ion-Trap Package for Thermal Isolation in Vacuum

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Solution Overview

Problem

Conventional ion trap systems face challenges such as anomalous heating, thermal coupling with ion sources, and the need for complex high-vacuum infrastructure, which limit the scalability and efficiency of quantum computing systems.

Innovation Solution

The ion trap and ion source are separated into distinct high-vacuum chambers on opposite sides of a chip carrier, with a conduit allowing atomic flux to propagate between them, reducing thermal coupling and enabling operation at cryogenic temperatures while maintaining high-vacuum conditions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If the ion trap and ion source are placed in the same chamber, then the system structure is simpler, but thermal coupling between the source and trap increases causing thermal interference

Engineering Contradiction:
Improvesystem structureVSAvoidthermal coupling
Core Design Contradiction:
Device complexityVSTemperature

Solution Approach 1:

The patent divides the vacuum system into separate chambers: a first chamber containing the ion trap and a second chamber containing the ion source. This segmentation physically separates components that would otherwise be in direct thermal contact, reducing thermal coupling while maintaining functional integration through the shared vacuum environment and controlled interfaces.

Inventive Principle:
Principle #1Segmentation

2Reliability

If conventional high-vacuum infrastructure is used, then vacuum levels are achieved, but the system becomes complex and cumbersome

Engineering Contradiction:
Improvevacuum levelVSAvoidinfrastructure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent integrates multiple vacuum chambers and functional components into a unified package structure where the first and second chambers share common walls and interfaces. This merging approach reduces the overall infrastructure complexity compared to separate vacuum systems while maintaining the required ultra-high vacuum levels through integrated pumping and sealing arrangements.

Inventive Principle:
Principle #5Merging (Combining)

3Reliability

If the ion trap operates at cryogenic temperatures, then thermal noise is reduced, but thermal coupling with the ion source becomes more problematic

Engineering Contradiction:
Improveion trap operationVSAvoidthermal interference
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent extracts the ion source from the ion trap chamber, placing it in a separate second chamber. This extraction removes the primary source of thermal interference from the cryogenic ion trap environment, allowing the trap to operate at low temperatures without direct thermal coupling to the typically warmer ion source, while still enabling ion loading through the shared vacuum interface.

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration reduces thermal interference, improves ion trap operation, and facilitates scalable quantum computing by minimizing thermal cross-talk and maintaining ultra-high vacuum levels, enhancing the performance and practicality of quantum computing systems.

Implementation Method 1

trapped-ion processing, which relies on electromagnetic fields to confine atomic ions in free space

Methodology Applied
Scientific EffectElectromagnetic fields: Electromagnetic Induction

Implementation Method 2

The first chamber and the second chamber are each maintained at an ultra-high vacuum level by a cryosorption pump

Methodology Applied
Scientific EffectCryosorption: Adsorption

Data Source

PatentUS11749518B2Package comprising an ion-trap and method of fabrication
Publication Date: 2023.09.05 DUKE UNIV
  • US11749518B2 patent drawing
  • US11749518B2 patent drawing
  • US11749518B2 patent drawing

AI summary

A package-level, integrated high-vacuum ion-chip enclosure having improved thermal characteristics is disclosed. Enclosures in accordance with the present invention include first and second chambers that are located on opposite sides of a chip carrier, where the chambers are fluidically coupled via a conduit through the chip carrier. The ion trap is located in the first chamber and disposed on the chip carrier. A source for generating an atomic flux is located in the second chamber. The separation of the source and ion trap in different chambers affords thermal isolation between them, while the conduit between the chambers enables the ion trap to receive the atomic flux.