Dual-Chamber Sample Analysis Apparatus for Wafer and Small Samples

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Solution Overview

Problem

Existing sample analysis apparatuses face difficulties in simultaneously analyzing standard samples with different shapes, such as silicon wafers and non-wafer samples, due to structural limitations of having only one chamber, which restricts the ability to perform quantitative analysis effectively.

Innovation Solution

A sample analysis apparatus with two chambers: one for heating small samples to generate a first reactive gas and another for heating wafer samples to generate a second reactive gas, each with its own support and heating device, allowing for the analysis of various sample types through a transfer module and pipes that direct the reactive gases to an analysis device.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If only one chamber is used in the sample analysis apparatus, then the device complexity is reduced, but the ability to simultaneously analyze different sample types (silicon wafers and non-wafer samples) deteriorates

Engineering Contradiction:
Improvechamber structureVSAvoidsample type analysis capability
Core Design Contradiction:
Device complexityVSAdaptability or versatility

Solution Approach 1:

The sample analysis apparatus is divided into multiple independent chambers (first chamber for small samples, second chamber for wafer samples), allowing each chamber to be optimized for specific sample types while maintaining overall system functionality

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Each chamber is designed with universal components (heating devices, supports, gas generation capabilities) that can handle different sample formats, enabling the system to analyze both small non-wafer samples and large wafer samples through the same analytical pipeline

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Device complexity

If a single chamber is used for all sample types, then the apparatus structure is simplified, but the measurement precision and consistency across different sample types deteriorates

Engineering Contradiction:
Improvechamber configurationVSAvoidquantitative analysis consistency
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

Each chamber is equipped with locally optimized components (specific heating devices, supports, and gas generation systems) tailored to the requirements of particular sample types, ensuring consistent measurement precision for both small samples and wafer samples

Inventive Principle:
Principle #3Local quality

3Device complexity

If only one chamber is used, then the device structure is simpler, but the analysis speed and efficiency for multiple sample types deteriorates

Engineering Contradiction:
Improvechamber systemVSAvoidanalysis speed
Core Design Contradiction:
Device complexityVSProductivity

Solution Approach 1:

The system segments sample analysis into parallel processing streams through separate chambers, allowing simultaneous analysis of different sample types without sequential bottlenecks, thereby improving overall analysis throughput and efficiency

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables efficient and consistent analysis of both small and large samples by selecting the appropriate chamber based on sample size, improving data consistency and analysis speed.

Implementation Method 1

a first heating device arranged on a lower surface of the first support and configured to heat the small sample

Methodology Applied
Scientific EffectThermal decomposition: Pyrolysis

Implementation Method 2

a second heating device arranged on a lower surface of the second support and configured to heat the wafer sample

Methodology Applied
Scientific EffectThermal decomposition: Pyrolysis

Implementation Method 3

a first pipe configured to move the first reactive gas from the first chamber toward the analysis device; a second pipe configured to move the second reactive gas from the second chamber toward the analysis device

Methodology Applied
Scientific EffectGas flow: Convection

Data Source

PatentUS20240077507A1Sample analysis apparatus and sample analysis method using the same
Publication Date: 2024.03.07 SAMSUNG ELECTRONICS CO LTD
  • US20240077507A1 patent drawing
  • US20240077507A1 patent drawing
  • US20240077507A1 patent drawing

AI summary

A sample analysis apparatus includes a first chamber that performs a first heating process for heating a small sample and a second chamber including a second chamber housing in which a second heating process for heating a wafer sample is performed. The first chamber includes a first chamber housing in which the first heating process is performed, a first support that supports the small sample, a first heating device that heats the small sample, an accommodation housing in which the small sample is accommodated, a sample tray arranged in the accommodation space, sample container configured to store the small sample, and a transfer module configured to transfer the sample container and the small sample from the accommodation housing to the first chamber.