Dual Column Address Decoders for DRAM Stability

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Solution Overview

Problem

The column addressing operation in memory devices, such as DRAM, is destabilized due to differences in signal characteristics and timings across the large physical size of the memory bank, leading to unstable data input/output operations.

Innovation Solution

The implementation of a memory device with dual strobe transfer paths and latch circuits synchronized with strobe signals to generate column select signals, ensuring equal signal strengths and timings across the memory bank, thereby stabilizing the column addressing operation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a single column decoder is used in a large memory bank, then device complexity is reduced, but signal characteristics and timings become unstable across different regions of the memory bank

Engineering Contradiction:
Improvecolumn addressing stabilityVSAvoiddecoder structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The memory bank is divided into two regions (first memory bank and second memory bank), each with its own column decoder (first column decoder and second column decoder). This segmentation allows each decoder to serve a specific region, reducing signal degradation and timing variations across the entire memory bank while maintaining overall system functionality.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Each region of the memory bank is equipped with a dedicated column decoder, allowing local optimization of signal characteristics and timing for each specific region. This ensures that signal strength and timing are appropriate for the local distance from the decoder, improving overall addressing stability.

Inventive Principle:
Principle #3Local quality

2Productivity

If the memory bank size is increased to improve capacity, then productivity is improved, but signal timing differences across the bank increase causing instability

Engineering Contradiction:
Improvememory capacityVSAvoidcolumn addressing stability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The large memory bank is segmented into multiple smaller regions, each with its own column decoder. This allows the memory bank to maintain large total capacity while ensuring that no single decoder has to drive signals across the entire large distance, thereby maintaining signal integrity and timing stability in each region.

Inventive Principle:
Principle #1Segmentation

3Productivity

If operating speed is increased to improve productivity, then productivity is improved, but timing differences across the memory bank cause instability

Engineering Contradiction:
Improveoperating speedVSAvoidcolumn addressing stability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

By dividing the memory bank into regions with dedicated decoders, the maximum signal travel distance is reduced. This allows higher operating speeds to be achieved because the timing constraints for each regional decoder are less severe than for a single decoder serving the entire large bank.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS10665279B2Memory device with two column address decoders and latches
Publication Date: 2020.05.26 SK HYNIX INC
  • US10665279B2 patent drawing
  • US10665279B2 patent drawing
  • US10665279B2 patent drawing

AI summary

A memory device includes a memory bank; a first latch circuit positioned at the one side of the memory bank, for latching a first column address in synchronization with a first strobe signal; a second latch circuit positioned at the other side of the memory bank, for latching a second column address in synchronization with a second strobe signal; a first column decoder positioned at the one side of the memory bank, for generating first column select signals in synchronization with the first strobe signal and the first column address; and a second column decoder positioned at the other side of the memory bank, for generating second column select signals in synchronization with the second strobe signal and the second column address.