Dual-Contact Electrical Connector for Stable High-Current Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current electrical connectors for testing electronic products are prone to damage, have a small contact area leading to instability and poor conductivity, and are inconvenient to assemble, especially when dealing with complex and sophisticated electronic devices.
Innovation Solution
An electrical connector with a molded integral structure featuring a planar first contact end and a toothed or linear second contact end, along with a groove structure for guiding and securing the product to be tested, ensuring increased contact area and stability, and an elastic portion for secure connection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a separated structure with elastic member is used, then conduction detection is enabled, but contact ends get damaged and elastic member deforms after long-time operation
Solution Approach 1:
The patent merges the contact ends and elastic member into a single integrated probe structure made of conductive elastomer material. This eliminates the separate components that were prone to damage and deformation, creating a unified structure that maintains both conduction detection capability and durability over extended operation periods.
Solution Approach 2:
The patent employs conductive elastomer material that combines the electrical conductivity of metals with the elasticity and durability of rubber-like materials. This composite material property allows the probe to maintain reliable conduction detection while resisting damage and deformation that would occur with traditional separate metal contact ends and elastic members.
2Reliability
If a separated structure is used, then conduction detection is achieved, but assembly is inconvenient and costs are high
Solution Approach 1:
The patent combines multiple separate components (contact ends, elastic member, housing) into a single integrated probe structure. This merger simplifies the assembly process by eliminating the need to assemble multiple parts, reduces manufacturing complexity, and lowers production costs while maintaining the conduction detection function.
3Volume of moving object
If a small contact area is used, then the connector is compact, but stability is poor, large current cannot be conducted and product scratching occurs
Solution Approach 1:
The patent changes the contact area parameter by providing multiple contact ends (first contact end with planar structure and second contact end with point or linear structure) that can be selectively engaged. This allows the connector to maintain a compact overall size while achieving sufficient contact area for stable conduction and high current capacity when the appropriate contact end is used.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enhances the stability and accuracy of electrical connections, allows for higher current conductivity, and reduces the risk of product damage by ensuring consistent contact points and effective alignment during testing.
Implementation Method 1
The first connection portion, the connection body and the second connection portion are molded integrally from conductive elastomer material
Implementation Method 2
The elastic portion is an S-shaped structure formed by at least one U-shaped member or C-shaped member in form of end-to-end connection. Under the action of an external force, an open end of the U-shaped member or C-shaped member contracts.
Data Source
AI summary
The present disclosure provides an electrical connector and a device for testing conduction which relate to the field of testing devices. By providing a first contact end having a planar structure, the contact area between the electrical connector and a testing substrate is increased, and a large current can be conducted and damage to the product and device is avoided. A second contact end is a point or linear structure, and when poor contact is caused due to the uneven testing substrate or oxidization of the testing substrate, effective contact and electrical connection with the testing substrate can be achieved, to improve the effectiveness of an electrical connection.