Dual Control Circuit Calibration Backup for Analysis Devices
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Solution Overview
Problem
The existing modular analysis systems, such as liquid chromatography systems, face the risk of losing unique calibration information stored in the control circuits due to damage from overvoltage, overcurrent, or heat generation, leading to operational failures.
Innovation Solution
The analysis device incorporates a dual-control circuit system, where both the main control circuit and sub-control circuit store calibration information, with a backup and restoration mechanism to ensure data integrity, using identification information to manage backups and restorations, and automatic or manual execution based on device combinations and states.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If calibration information is stored only in the main control circuit, then the device structure is simple, but the calibration information is lost when the main control circuit is damaged
Solution Approach 1:
The patent creates a backup copy of the calibration information stored in the main control circuit and stores it in the sub-control circuit. This copying mechanism ensures that if the main control circuit is damaged, the calibration information can be restored from the sub-control circuit, thereby improving reliability without significantly increasing overall device complexity.
Solution Approach 2:
The patent divides the control function into two separate control circuits: the main control circuit for primary control operations and the sub-control circuit for backup and general-purpose operations. This segmentation allows the calibration information to be protected by distributing storage across multiple independent circuits, improving reliability while maintaining manageable device complexity.
2Reliability
If backup information is stored in the sub-control circuit, then calibration information loss is prevented, but the device complexity increases due to additional storage and management mechanisms
Solution Approach 1:
The sub-control circuit is designed to serve multiple functions: it acts as a backup storage for calibration information, handles general-purpose control operations, and manages the backup and restoration processes. This multi-functionality reduces the need for dedicated separate components, thereby limiting the increase in device complexity while achieving reliable backup capability.
3Loss of information
If identification information is used to manage backup and restoration, then data integrity is ensured, but the operation complexity increases
Solution Approach 1:
The backup and restoration system automatically uses identification information to verify data integrity and execute appropriate operations without requiring complex manual intervention. The system self-manages the backup process by comparing identification information between the main control circuit and sub-control circuit, and automatically restores calibration information when needed, thereby ensuring data integrity while maintaining ease of operation.
Data Source
AI summary
An analysis device includes a main control circuit, a sub-control circuit, a backup execution part, and a restoration execution part. The main control circuit has a calibration information storage area for storing calibration information unique to the analysis device, and is configured to perform operation control unique to the analysis device using the calibration information. The sub-control circuit is communicable with the main control circuit and has a backup information storage area for storing the same information as the calibration information in the calibration information storage area. The backup execution part is configured to execute backup for storing information same as the calibration information stored in the calibration information storage area in the backup information storage area. The restoration execution part executes restoration for restoring the calibration information in the calibration information storage area based on the backup information stored in the backup information storage area of the sub-control circuit.