Dual-Crystal Ultrasonic Probe Sensitivity Testing

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Solution Overview

Problem

Traditional methods for testing the sensitivity of dual-crystal ultrasonic probes are time-consuming and not suitable for large-scale or outdoor applications, such as railway wheel flaw detection, which requires a rapid and automated process without the need for standard test blocks.

Innovation Solution

An automatic sensitivity testing method that uses the interface waves generated by the dual-crystal ultrasonic probe itself, eliminating the need for a standard test block, by independently emitting and receiving ultrasonic signals to adjust gain values until reference amplitudes are reached, indicating qualified sensitivity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional standard test block method is used for sensitivity testing, then measurement precision is improved, but testing time increases significantly

Engineering Contradiction:
Improvesensitivity testing accuracyVSAvoidtesting time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The ultrasonic probe uses itself as the test object by generating interface waves at its own end face. The probe's emitter transmits ultrasonic waves that reflect off the end face and return to the receiver, creating interface waves that are used to assess sensitivity. This self-testing approach eliminates the need for external standard test blocks and significantly reduces testing time.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent creates a simplified copy of the standard test block method by using the probe's own end face as the testing medium. Instead of requiring a physical standard test block with artificial defects, the system uses the interface wave generated at the probe's end face as a surrogate for the standard defect response, achieving rapid sensitivity assessment.

Inventive Principle:
Principle #26Copying

2Measurement precision

If traditional manual sensitivity testing method is used, then measurement precision is improved, but device complexity and operation difficulty increase

Engineering Contradiction:
Improvesensitivity testing accuracyVSAvoidtesting operation simplicity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The system performs automatic self-testing without requiring manual intervention or external standard test blocks. The probe's emitter and receiver automatically generate and detect interface waves, and the system autonomously compares wave amplitudes against reference values to determine sensitivity status, greatly simplifying the operation.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces the mechanical/physical standard test block with an automated electronic measurement system. Instead of manually positioning and interpreting reflections from physical defects in a standard block, the system uses electronic signal generation and amplitude comparison to automatically assess sensitivity, reducing operational complexity.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If traditional sensitivity testing method is used for large number of probes, then measurement precision is maintained, but productivity decreases

Engineering Contradiction:
Improvesensitivity testing accuracyVSAvoidtesting throughput
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

Each probe performs its own sensitivity test independently using the self-testing method, eliminating the need for centralized testing with standard blocks. This allows multiple probes to be tested simultaneously and in parallel, dramatically increasing throughput while maintaining measurement precision through automated amplitude comparison.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system uses a simplified digital copy of the sensitivity testing process that can be rapidly repeated for each probe. By using interface waves and automated amplitude comparison instead of physical standard blocks, the testing process can be quickly replicated across hundreds of probes without loss of precision.

Inventive Principle:
Principle #26Copying

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method enables rapid and efficient self-checking of ultrasonic probes, significantly reducing testing time and adapting to the demands of large-scale and outdoor flaw detection systems, particularly in rail transit applications.

Implementation Method 1

a wafer of the emitter or the echo pole generating an ultrasonic wave

Methodology Applied
Scientific EffectUltrasonic wave generation: Ultrasonic Vibration

Implementation Method 2

the ultrasonic wave is reflected and transmitted to the left-side receiving wafer

Methodology Applied
Scientific EffectUltrasonic reflection: Reflection

Data Source

PatentUS20250003998A1A method of automatically testing the sensitivity of a type of dual-crystal ultrasonic probe (also called ultrasonic transducer) and the detection system with the probes
Publication Date: 2025.01.02 NANJING TYCHO INFORMATION TECH
  • US20250003998A1 patent drawing
  • US20250003998A1 patent drawing
  • US20250003998A1 patent drawing

AI summary

The present invention discloses an automatic sensitivity testing method for a dual-crystal ultrasonic probe and a flaw detection system. The sensitivity automatic testing method does not require a standard test block; and an emitter and an echo pole of the dual-crystal ultrasonic probe emit and receive interface waves independently of each other: the wafer of the emitter or the echo pole generating an ultrasonic wave, the end face of the dual-crystal ultrasonic probe performing emission to form an interface wave, and the interface wave being received by the wafer generating the ultrasonic wave; or the emitter and the echo pole of the dual-crystal ultrasonic probe being in parallel to form an emitting and echo pole; and the wafer emitting the echo pole generating ultrasonic waves, and the end face of the dual-crystal ultrasonic probe performing emission to form an interface wave, which is received by the wafer emitting the echo pole. The present invention can automatically test the sensitivity of the dual-crystal ultrasonic probe and the flaw detection system thereof rapidly in a short time without a standard test block.