Dual Dresser CMP Pad Conditioning for Asperity Control

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Solution Overview

Problem

The semiconductor industry faces challenges in maintaining the performance of Chemical Mechanical Polishing (CMP) pads due to glazing, which leads to non-uniform asperity configurations on the pads, affecting the polishing of large diameter wafers with nanometer-sized features, and traditional dressing methods often result in warpage and loss of control over superabrasive particle tips.

Innovation Solution

A dual dressing system is introduced, where a deglazing dresser and an asperity-forming dresser are used independently to condition CMP pads, allowing for precise control over the surface by deglazing and forming asperities separately, using smaller diameter tools to minimize warpage and achieve uniform asperity formation with superabrasive particles arranged in a monolayer for optimal polishing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If traditional single dresser methods are used to condition CMP pads, then the process is simple and fast, but warpage occurs and control over superabrasive particle tips is lost

Engineering Contradiction:
Improveconditioning speedVSAvoidcontrol over superabrasive particle tips
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The single dresser is divided into two separate dressers: a deglazing dresser with blade elements for removing glazed layers, and an asperity-forming dresser with superabrasive particles for creating uniform asperities. This segmentation allows each dresser to perform its specific function independently, preventing warpage and maintaining control over particle tips while keeping the overall process efficient

Inventive Principle:
Principle #1Segmentation

2Area of stationary object

If larger diameter tools are used for dressing CMP pads, then the coverage area is larger, but warpage increases and control is lost

Engineering Contradiction:
Improvedressing coverage areaVSAvoidcontrol over dressing process
Core Design Contradiction:
Area of stationary objectVSManufacturing precision

Solution Approach 1:

Instead of using one large diameter dresser that causes warpage, the system uses two smaller diameter dressers. The deglazing dresser and asperity-forming dresser each have smaller diameters that minimize warpage while collectively covering the required area through sequential operation on the rotating CMP pad

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system transitions from a single-plane dressing approach to a multi-dimensional process where two separate dressers operate at different stages. The deglazing dresser prepares the surface, and the asperity-forming dresser creates the final surface structure, allowing precise control in each dimension of the dressing process

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Productivity

If deglazing and asperity formation are performed simultaneously, then the process is faster, but uniformity of asperity configuration is compromised

Engineering Contradiction:
Improveconditioning speedVSAvoiduniformity of asperity configuration
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The conditioning process is segmented into two sequential stages: deglazing followed by asperity formation. This separation ensures that asperities are formed on a freshly deglazed surface, guaranteeing uniform asperity configuration while maintaining high productivity through efficient sequential operation

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The deglazing dresser performs preliminary action by removing the glazed layer before the asperity-forming dresser creates asperities. This preliminary preparation ensures that the asperities are formed on a clean, uniform surface, achieving the desired uniformity without sacrificing overall process speed

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances the uniformity and effectiveness of CMP pad conditioning, enabling better polishing of large diameter wafers with nanometer features by maintaining precise control over asperity formation and reducing warpage, thus extending the life of the CMP pads and improving polishing efficiency.

Implementation Method 1

deglazing the working surface of the CMP pad with the deglazing dresser... shaving off a thickness of the working surface of the CMP pad

Methodology Applied
Scientific EffectAbrasion: Abrasion

Implementation Method 2

forming asperities in the working surface of the CMP pad with the asperity-forming dresser

Methodology Applied
Scientific EffectAbrasion: Abrasion

Implementation Method 3

applying a cleansing spray to the working surface during deglazing... the cleansing spray is a water jet

Methodology Applied
Scientific EffectFluid spray cleaning: Fluid Spray

Implementation Method 4

applying a suction to the working surface to remove debris released from the CMP pad during deglazing

Methodology Applied
Scientific EffectSuction: Suction

Implementation Method 5

vibrating at least one of, or both of, the deglazing dresser and the CMP pad relative to one another during deglazing... the vibrating is ultrasonic vibrating

Methodology Applied
Scientific EffectUltrasonic vibration: Ultrasonic Vibration

Data Source

PatentUS8920214B2Dual dressing system for CMP pads and associated methods
Publication Date: 2014.12.30 KINIK
  • US8920214B2 patent drawing
  • US8920214B2 patent drawing
  • US8920214B2 patent drawing

AI summary

Dual dressing systems for conditioning CMP pads, including associated methods, are provided. In one aspect, for example, a method of dressing a CMP pad can include applying a deglazing dresser to a working surface of a CMP pad, deglazing the working surface of the CMP pad with the deglazing dresser, applying an asperity-forming dresser to the working surface of the CMP pad, and forming asperities in the working surface of the CMP pad with the asperity-forming dresser.