Dual Frequency Comb Ellipsometer for High-Throughput Metrology

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Traditional Mueller Matrix Spectroscopic Ellipsometry (MMSE) techniques fail to meet the throughput and spot size requirements for characterizing complex and small semiconductor structures.

Innovation Solution

A measurement system utilizing dual frequency combs with different repetition rates, where one is frequency or phase-locked to the other, combined with coding optical elements that encode transfer matrix data into spatial, spectral, or temporal domains of images, enabling efficient generation of transfer matrix datasets.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If traditional Mueller Matrix Spectroscopic Ellipsometry (MMSE) techniques are used, then measurement capability is provided, but throughput and spot size requirements are not met

Engineering Contradiction:
ImprovethroughputVSAvoidmeasurement capability
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent segments the measurement process by using multiple frequency combs with different repetition rates to simultaneously measure different aspects of the sample's optical properties. This allows parallel processing of multiple measurement tasks, thereby increasing throughput while maintaining measurement precision through the dual-frequency comb approach.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces an additional temporal dimension by using frequency combs with different repetition rates. This enables encoding of multiple transfer matrix elements into the temporal domain of the measured signal, allowing simultaneous extraction of multiple optical parameters without compromising measurement accuracy.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If traditional MMSE techniques are used, then measurement capability is provided, but spot size requirements are not met

Engineering Contradiction:
Improvemeasurement capabilityVSAvoidspot size
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The patent segments the illumination beam into multiple frequency components using dual frequency combs, allowing different spatial modes to be measured simultaneously. This enables the system to achieve both small spot size for high-resolution imaging and sufficient throughput by measuring multiple spatial frequencies at once.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The dual frequency comb system provides multi-functionality by simultaneously enabling spectrally resolved measurements, spatially resolved imaging, and polarization state analysis. This universal approach allows a single system to meet both small spot size requirements and throughput requirements without sacrificing either capability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Measurement precision

If coding optical elements are added to encode transfer matrix data, then measurement capability is enhanced, but device complexity increases

Engineering Contradiction:
Improvetransfer matrix measurement capabilityVSAvoidoptical system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces coding optical elements as intermediaries that modulate the frequency comb signal to encode transfer matrix elements. These elements act as mediators between the illumination source and the detector, enabling information encoding without requiring complex computational processing, thus enhancing measurement capability while managing device complexity.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces complex mechanical modulation systems with optical coding elements that encode information directly in the optical domain. This substitution reduces mechanical complexity while enhancing measurement precision by enabling simultaneous encoding of multiple transfer matrix elements through optical phase and amplitude modulation.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for high-throughput, spatially and spectrally resolved transfer matrix measurements, overcoming the limitations of traditional MMSE techniques by providing stable and robust metrology data without the need for moving parts.

Implementation Method 1

a first frequency comb source configured to generate a first frequency comb; a second frequency comb source configured to generate a second frequency comb

Methodology Applied
Scientific EffectFrequency comb generation:

Implementation Method 2

one or more coding optical elements including at least one of one or more optical retarders or one or more polarizers

Methodology Applied
Scientific EffectPolarization modulation: Polarisation

Implementation Method 3

an imaging sub-system including one or more imaging lenses and a detector configured to generate a sequence of images of the sample

Methodology Applied
Scientific EffectPhotoelectric conversion: Photoelectric Effect

Data Source

PatentUS20250052666A1Dual frequency comb imaging spectroscopic ellipsometer
Publication Date: 2025.02.13 KLA CORP
  • US20250052666A1 patent drawing
  • US20250052666A1 patent drawing
  • US20250052666A1 patent drawing

AI summary

A measurement system may direct an illumination beam including at least one of a first frequency comb or a second frequency comb to a sample, and generate a sequence of images of the sample based on the first frequency comb and the second frequency comb. The system may include one or more coding optical elements to encode data associated with one or more transfer matrix elements into the sequence of images of the sample. The system may further generate a transfer matrix dataset including measurements of at least one of the one or more transfer matrix elements associated with the sample based on at least one of spectral, spatial, or temporal analysis of the sequence of images, and generate one or more measurements of the sample based on the transfer matrix dataset.