Dual-Frequency Substrate Heating for Uniform Semiconductor Annealing

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Solution Overview

Problem

In the heat treatment process for semiconductor substrates using electromagnetic waves, non-uniform heating can cause warping or cracking of the substrates.

Innovation Solution

A substrate processing apparatus that uses a combination of two electromagnetic waves with controlled frequencies and phase differences to achieve uniform heating, employing a process chamber, electromagnetic wave sources, and a frequency controller to adjust the electromagnetic field distribution within the chamber.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a single electromagnetic wave source is used for heating the substrate, then the heating process is simple, but the heating uniformity is poor causing substrate warping or cracking

Engineering Contradiction:
Improveheating uniformityVSAvoidelectromagnetic wave source configuration
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The single electromagnetic wave source is divided into multiple electromagnetic wave sources (first and second electromagnetic wave sources). Each source operates independently to heat different regions of the substrate, thereby improving heating uniformity while avoiding the warping and cracking caused by non-uniform heating from a single source.

Inventive Principle:
Principle #1Segmentation

2Manufacturing precision

If multiple electromagnetic wave sources are used to improve heating uniformity, then heating uniformity improves, but the device complexity increases

Engineering Contradiction:
Improveheating uniformityVSAvoidfrequency control system
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The frequencies of the multiple electromagnetic wave sources are set to different values (first frequency and second frequency). This parameter differentiation allows each wave source to contribute uniquely to the heating process, improving overall heating uniformity while managing system complexity through controlled frequency variation.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The electromagnetic wave sources operate in a coordinated periodic manner with controlled phase differences. By adjusting the phase relationships between the waves from different sources, the system achieves constructive and destructive interference patterns that promote uniform energy distribution across the substrate surface.

Inventive Principle:
Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach ensures more uniform heating distributions, reducing the likelihood of substrate warping or cracking and improving the overall processing consistency.

Implementation Method 1

a heat treatment process (annealing process) using an electromagnetic wave

Methodology Applied
Scientific EffectElectromagnetic radiation heating: Electromagnetic Induction

Implementation Method 2

a frequency controller configured to be capable of controlling at least one of a frequency of the first electromagnetic wave or a frequency of the second electromagnetic wave

Methodology Applied
Scientific EffectFrequency control of electromagnetic waves:

Data Source

PatentUS20240242983A1Substrate processing apparatus, substrate processing method, method of manufacturing semiconductor device and non-transitory computer-readable recording medium
Publication Date: 2024.07.18 KOKUSAI DENKI KK
  • US20240242983A1 patent drawing
  • US20240242983A1 patent drawing
  • US20240242983A1 patent drawing

AI summary

There is provided a technique capable of improving the uniformity of heating the substrate in the heat treatment process using the electromagnetic wave. The technique includes a process chamber in which a substrate is processed; an electromagnetic wave source configured to output a first electromagnetic wave and a second electromagnetic wave at least partially at the same time to the process chamber; and a frequency controller configured to be capable of controlling at least one of a frequency of the first electromagnetic wave or a frequency of the second electromagnetic wave.