Dual Galvanometer Optical Field Imaging System
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Solution Overview
Problem
Traditional optical imaging systems face challenges in achieving high-resolution three-dimensional imaging of tumor cells due to limitations in scanning technology, leading to issues like rotation, stripes, and sawteeth in reconstructed images.
Innovation Solution
An optical field imaging system based on dual galvanometer scanning, which uses two non-parallel two-dimensional galvanometers to deflect the optical path in the X and Y directions, thereby optimizing the scanning process and improving image resolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If a single two-dimensional galvanometer is used for deflection in x and y directions to realize scanning function, then the scanning function is achieved, but central optical axis is deflected and inconsistency between deflection angle and preset angle occurs causing precession phenomenon
Solution Approach 1:
The patent divides the single galvanometer into two separate one-dimensional galvanometers, each responsible for deflecting the light beam in a specific direction. This segmentation eliminates the coupling effect between x and y deflections, preventing optical axis deviation and precession, thereby improving image quality while maintaining scanning functionality.
2Measurement precision
If traditional optical imaging systems use scanning to achieve three-dimensional imaging, then three-dimensional imaging is achieved, but it takes a lot of time making it difficult to capture dynamic process
Solution Approach 1:
The patent employs periodic scanning motion of the galvanometers to systematically capture optical field information at multiple positions. By using periodic scanning patterns combined with optical field microscopy, the system efficiently collects three-dimensional data over time, balancing the need for precise 3D imaging with the requirement to capture dynamic cellular processes.
3Productivity
If optical field microscopic imaging system is used to obtain three-dimensional information through single shot, then three-dimensional information is obtained quickly, but the reconstructed image has low resolution limiting subcellular structure research
Solution Approach 1:
The patent combines optical field microscopy with a segmented scanning approach using two one-dimensional galvanometers. This hybrid method retains the single-shot capability for capturing dynamic processes while adding directional scanning to resolve spatial frequencies, thereby achieving both high imaging speed and high resolution for detailed subcellular structure observation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The dual galvanometer system effectively eliminates issues of rotation, stripes, and sawteeth, resulting in higher image reconstruction quality and enabling more accurate observation of subcellular structures in tumor cells.
Implementation Method 1
The galvanometer unit is composed of two non-parallel two-dimensional galvanometers which deflect beams in two directions of X axis and Y axis respectively, so that an input beam is perpendicular to an output beam
Implementation Method 2
The microlens array is located at an image plane position, and used for obtaining beams of different angles at different spatial local positions outputted by the galvanometer unit, and modulating the information corresponding to different angles to different spatial positions corresponding to each microlens
Data Source
AI summary
The present invention relates to the technical field of optical imaging, in particular to an optical field imaging system based on dual galvanometer scanning, comprising: an imaging unit, a galvanometer unit, a microlens array, a relay system and a camera which are arranged successively along a transmission direction of an optical path. The imaging unit is used for optically imaging a sample or a scenario. The galvanometer unit is composed of two non-parallel two-dimensional galvanometers which deflect beams in two directions of X axis and Y axis respectively, so that an input beam is perpendicular to an output beam. After the beam outputted by the galvanometer unit passes through the microlens array and the relay system, the beam is collected by the camera to obtain the stack information of optical field images.