Dual-Gate Active Device Substrate for High-Resolution Displays
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Solution Overview
Problem
High-resolution display panels face challenges in accommodating dual-gate active devices due to limited space, leading to easy electric leakage in active device substrates.
Innovation Solution
An active device substrate design that includes a dual-gate structure with shared scan lines, where the first and second gates are electrically connected to different scan lines, overlapping to prevent electric leakage while maintaining or improving the aperture ratio without increasing the total number of scan lines.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a dual-gate active device is arranged in a high-resolution display panel with limited space, then the electric leakage problem can be solved, but the space for accommodating scan lines becomes insufficient
Solution Approach 1:
The patent merges the function of two separate scan lines into a single shared scan line. The first scan line serves as the first scan line for the first active device and also as the second scan line for the second active device, thereby reducing the total number of scan lines and saving space while still enabling dual-gate control to prevent electric leakage
Solution Approach 2:
The first scan line is designed to perform multiple functions: it acts as the first scan line for the first active device and simultaneously serves as the second scan line for the second active device. This multi-functional design reduces the overall number of scan lines needed in the display panel
2Area of stationary object
If the number of scan lines is reduced to accommodate limited space, then the aperture ratio can be improved, but the ability to control dual-gate active devices is compromised
Solution Approach 1:
The patent combines the control functions of two scan lines into one shared scan line. By carefully designing the timing and signals applied to the shared scan line, the system maintains the ability to independently control both gates of the active devices while using fewer scan lines, thus improving aperture ratio without losing dual-gate control capability
Solution Approach 2:
The patent employs dynamic signal timing and switching to enable a single scan line to perform the function of two scan lines. By dynamically controlling when and how signals are applied to the shared scan line, the system maintains full dual-gate control capability while reducing the static number of scan lines required
Data Source
AI summary
An active device substrate includes a substrate, first to third scan lines, a first data line, a second data line, a first active device, and a first pixel electrode. The first scan line, the second scan line, and the third scan line are extending along a first direction. The first data line and the second data line are extending along a second direction. The first active device includes a first gate, a second gate, a first semiconductor pattern layer, a first source, and a first drain. The first gate is electrically connected to the first scan line. The second gate is electrically connected to the second scan line. The first scan line and the second scan line transmit different driving signals. The first source is electrically connected to the first data line. The first pixel electrode is electrically connected to the first drain of the first active device.