Dual Gate Driving Circuit for Real-Time Display Panel Defect Detection
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Solution Overview
Problem
Existing display devices face challenges in effectively detecting defects in display panels, particularly when sensing lines are absent in subpixel circuits or current detection through driving transistors is not feasible, limiting real-time defect determination.
Innovation Solution
A display device with a gate driving circuit configuration that includes two gate driving circuits operating in a defect detecting mode during blank periods, where one circuit performs a sensing data writing operation and the other receives a scan signal, enabling effective detection of defects in display panels.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a sensing line is not present in the subpixel circuit or current detection through the driving transistor is not available, then the device complexity is reduced, but the ability to detect defects in real-time deteriorates
Solution Approach 1:
The patent introduces a sensing transistor as an intermediary component within the subpixel circuit that enables indirect detection of driving transistor characteristics. Instead of directly measuring current through the driving transistor or adding complex sensing lines, the sensing transistor acts as a mediator that copies the driving transistor's current characteristics and makes them measurable through existing circuit nodes, thus enabling defect detection without significantly increasing device complexity
Solution Approach 2:
The patent replaces direct electrical current measurement (which would require sensing lines and complex measurement circuits) with a transistor-based sensing mechanism. By using the sensing transistor to replicate and transfer current characteristics to measurable voltage nodes, the system substitutes a simpler electrical measurement approach for the more complex direct current sensing approach
2Ease of manufacture
If a sensing line is not present in the subpixel circuit, then the manufacturing process is simplified, but the measurement precision of subpixel characteristics deteriorates
Solution Approach 1:
The sensing transistor serves as an intermediary that enables precise measurement of driving transistor characteristics without requiring additional sensing lines. It transfers the driving transistor's current information to accessible voltage nodes through standard transistor operation, maintaining measurement precision while avoiding the manufacturing complexity of integrating sensing lines
Solution Approach 2:
The sensing transistor creates a copy of the driving transistor's current characteristics by operating in parallel and copying its electrical behavior. This copied signal can then be measured at accessible nodes with high precision, achieving accurate subpixel characteristic detection without modifying the original driving transistor or adding complex sensing infrastructure
3Reliability
If double gate driving circuits are used for defect detection during blank periods, then the defect detection capability is improved, but the device complexity increases
Solution Approach 1:
The gate driving circuit is designed with multi-functionality, serving both normal display scanning operations and defect detection functions. By configuring the circuit to operate in different modes (normal scanning mode and defect detection mode) using the same hardware components, the system achieves enhanced defect detection capability without permanently increasing device complexity through dedicated separate circuits
Solution Approach 2:
The patent implements defect detection during blank periods using periodic action. The gate driving circuit alternates between normal display operations and defect detection operations in a periodic manner, utilizing idle time periods to perform sensing operations. This approach enables comprehensive defect detection capability while maintaining normal display functionality, as the detection operations are performed periodically during otherwise unused time slots
Data Source
AI summary
A display device includes a display panel in which a plurality of gate lines are arranged in a first direction, and a plurality of subpixel arrays each including a plurality of subpixels are arranged in the first direction; a gate driving circuit including a first gate driving circuit located in one edge of the display panel and a second gate driving circuit located in another edge of the display panel, the first gate driving circuit and the second gate driving circuit sharing one gate line connected to one subpixel array; and a timing controller for controlling the gate driving circuit to operate in a defect detecting mode to detect a defect in the display panel during a blank periods in which at least one of the plurality of subpixels of the display panel does not emit light.