Dual Gate Cell Panel Testing Circuit Segmentation
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Solution Overview
Problem
Conventional shorting bar testing architectures for dual gate cell panels cannot display red, green, and blue colors individually, leading to undetected defects during the testing process, resulting in unnecessary manufacturing costs as defective panels progress through the manufacturing process before being detected and discarded.
Innovation Solution
A testing circuit that divides data lines into three groups, each coupled to specific sub-pixels, allowing for individual control of red, green, and blue sub-pixels through distinct scan and data lines, enabling the display of colors by applying specific periodic signals to the test pads.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If all data lines and scan lines are electrically coupled together through shorting bars, then the testing circuit structure is simplified, but individual color display capability is lost and defect detection precision deteriorates
Solution Approach 1:
The patent segments the data lines into three distinct groups (first group of data lines, second group of data lines, third group of data lines), where each group is electrically coupled to a separate test pad. This segmentation enables individual control of red, green, and blue sub-pixels, allowing precise defect detection for each color channel while maintaining a relatively simple testing circuit structure.
2Ease of manufacture
If all scan lines are electrically coupled through a single metal wire, then the testing circuit is easier to manufacture, but the ability to display individual colors and detect defects deteriorates
Solution Approach 1:
The patent divides the scan lines into two groups (first group of scan lines, second group of scan lines), with each group electrically coupled to a separate test pad. This segmentation allows independent control of different pixel rows, enabling individual color display and comprehensive defect detection while maintaining manufacturing simplicity through the use of metal wires.
Solution Approach 2:
The testing circuit is designed to perform multiple functions: it can display individual colors (red, green, blue) by selecting different data line groups, display patterns by controlling different scan line groups, and detect defects in various regions of the panel. This multi-functionality is achieved while maintaining ease of manufacture through systematic line grouping and coupling.
3Loss of energy
If the conventional shorting bar testing architecture is used, then manufacturing costs are reduced at the testing stage, but defective panels progress through the manufacturing process unnecessarily, increasing overall manufacturing costs
Solution Approach 1:
The patent implements comprehensive defect detection during the display test stage by enabling individual color display and pattern display capabilities. This preliminary action allows defective panels to be identified early in the manufacturing process, preventing unnecessary progression of defective products and reducing overall manufacturing costs despite increased testing capability.
Data Source
AI summary
A testing circuit of a dual gate cell panel and a color display method of the dual gate cell panel. There are many data lines and scan lines in the dual gate cell panel, and the data lines are divided into three groups, and the scan lines are divided into two groups. The data lines or scan lines of each group are connected respectively to metal wires with a test pad each. When an appropriate signal is inputted to each test pad, the dual gate cell panel shows red, green and blue colors individually, so that defects of the dual gate cell panel can be detected accurately to avoid any unnecessary waste on the defective dual gate cell panel incurred in the subsequent manufacturing processes.