Dual Image Sensor with Band-Pass Filtering for Miniature Spectroscopy
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Solution Overview
Problem
Miniaturization of spectroscopes is required to accommodate the shrinking size of mobile devices, such as smartphones and wearables, while maintaining their functionality in obtaining physical property information of objects.
Innovation Solution
A dual image sensor with a band-pass filter layer and a planarization layer, where the band-pass filter layer transmits specific wavelength light to the image sensor, and the planarization layer ensures evenness with the image sensor, utilizing a combination of materials like silicon oxide, silicon nitride, and resin, and includes a pattern reflection layer for guided mode resonance, allowing for accurate physical property information capture.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a band-pass filter layer is added to the image sensor to obtain physical property information, then the functionality is improved, but the device complexity increases
Solution Approach 1:
The patent combines the band-pass filter layer with the image sensor structure, integrating spectral filtering capability directly into the sensor. The filter layer is positioned between the pixels and the microlens array, merging the filtering function with the existing imaging components rather than adding a separate spectroscope device.
Solution Approach 2:
The image sensor is designed to perform multiple functions: standard color imaging through the second area and spectral/physical property detection through the first area with the band-pass filter. This multi-functional design allows a single device to replace both a conventional image sensor and a separate spectroscope.
2Manufacturing precision
If a planarization layer is added to ensure evenness with the band-pass filter layer, then the manufacturing precision is improved, but the device complexity increases
Solution Approach 1:
The planarization layer is introduced to pre-compensate for thickness variations before subsequent manufacturing steps. By establishing a flat surface early in the fabrication process, the planarization layer prevents alignment and deposition issues that would arise from an uneven surface, simplifying later manufacturing steps.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the miniaturization of spectroscopic devices while maintaining the ability to obtain physical property information of objects with high accuracy, reducing manufacturing complexity and costs by simplifying the band-pass filter layer's design and enhancing the image sensor's functionality.
Implementation Method 1
a band-pass filter layer provided on the first area, the band-pass filter layer being configured to transmit, to the image sensor, light that is emitted by an object and has a specific wavelength corresponding to physical property information of the object
Implementation Method 2
the at least one filter unit of the plurality of filter units include a cavity layer, a Bragg reflection layer provided on a first surface of the cavity layer, and a pattern reflection layer provided on a second surface of the cavity layer that is opposite the first surface of the cavity layer, the pattern reflection layer being configured to generate guided mode resonance
Data Source
AI summary
Provided are a dual image sensor including an image sensor including a first area and a second area, the first area and the second area including a plurality of pixels, respectively, a band-pass filter layer provided on the first area, the band-pass filter layer configured to transmit light emitted by an object and having a specific wavelength corresponding to physical property information of the object to the image sensor, and a planarization layer provided on the second area and on the same plane as the band-pass filter layer.