Dual Ion Source Analyzing Magnet for Low-Downtime Implantation
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Solution Overview
Problem
Conventional ion implantation systems face productivity issues due to ion source life problems, such as erosion and x-ray radiation concerns, which require shutdowns for maintenance and species changes, leading to downtime and reduced productivity.
Innovation Solution
An ion implantation system with a mass analyzing magnet configured to accept ions from multiple sources, using shields to prevent x-ray transmission and allow simultaneous operation and maintenance, enabling individual access and maintenance of ion sources without shutting down the system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple ion sources are implemented for changing ion species or maintenance, then ion species versatility is improved, but system shutdown time increases due to safety requirements
Solution Approach 1:
The system is divided into separate operational zones: an active ion source region and a maintenance region. The analyzing magnet configuration allows one ion source to operate while another is maintained, segmenting the maintenance process from continuous operation. This enables parallel operation and maintenance of different ion sources without requiring full system shutdown.
Solution Approach 2:
The analyzing magnet acts as an intermediary element that receives ion beams from multiple sources. By configuring the magnet with specific pole arrangements and beam paths, it enables selective operation of different ion sources while maintaining system continuity. The magnet geometry allows one source to be active while another is accessed for maintenance.
2Productivity
If ion sources are accessed for maintenance during operation, then productivity is improved, but x-ray radiation safety risks increase
Solution Approach 1:
The system segments ion sources into separate accessible positions (e.g., first and second ion sources at different locations). When one ion source requires maintenance, the system can switch to another ion source while maintaining production. This spatial segmentation allows maintenance access without exposing personnel to x-ray radiation from active sources.
Solution Approach 2:
The dual ion source configuration with the analyzing magnet enables continuous ion beam production. While one ion source is maintained, the other continues to produce ions for implantation. This continuity eliminates downtime and maintains productivity while managing radiation safety through source isolation.
3Device complexity
If conventional single ion source configuration is used, then system simplicity is maintained, but ion source lifetime and productivity are reduced due to shutdown requirements
Solution Approach 1:
The analyzing magnet is configured to handle ion beams from multiple ion sources universally. The same magnet structure and beamline components serve both ion sources, allowing the system to switch between sources without requiring duplicate beamlines. This multi-functionality maintains relative system simplicity while enabling continuous operation through source redundancy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration allows for continuous operation with minimal downtime, extended ion source lifetimes, and reduced maintenance complexities, enhancing productivity by enabling safe and concurrent maintenance of ion sources.
Implementation Method 1
a mass analyzing magnet configured to accept ions from multiple sources
Implementation Method 2
mass analyze the first ion beam and second ion beam, respectively
Implementation Method 3
using shields to prevent x-ray transmission
Data Source
AI summary
An ion implantation system has a mass analyzing magnet having interior and exterior region and defining a first entrance, second entrance, and an exit. A first ion source defines a first ion beam directed toward the first entrance along a first beam path. A second ion source defines a second ion beam directed toward the second entrance along a second beam path. A magnet current source supplies a magnet current to the mass analyzing magnet. Magnet control circuitry controls a polarity of the magnet current based on a formation of the first or second ion beam. The mass analyzing magnet mass analyzes the respective first or second ion beam to define defining a mass analyzed ion beam along a mass analyzed beam path. At least one shield in the interior or exterior region prevents line-of-sight between the first and second ion sources. Beamline components modify the mass analyzed ion beam.


