Dual-Layer X-Ray Detector for Resolution and Absorption
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Solution Overview
Problem
Existing X-ray imaging technologies face challenges in achieving high spatial resolution and high X-ray absorption simultaneously, as scintillators used for 2D and 3D imaging require different thicknesses, leading to trade-offs in energy absorption and contrast.
Innovation Solution
A dual-layer X-ray detector system with a thin first scintillator and a thicker second scintillator, each paired with a sensor array, allows for different imaging modes: low energy imaging with the thin scintillator, high energy imaging with the thick scintillator, and combined energy imaging by combining data from both, using binning processes to maintain resolution and speed.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the scintillator is made thinner to provide high spatial resolution, then lateral light diffusion is reduced, but X-ray absorption efficiency decreases
Solution Approach 1:
The scintillator is divided into multiple discrete layers (first scintillator layer and second scintillator layer) with different thicknesses. The first layer is thinner for high-resolution imaging, while the second layer is thicker for high-absorption imaging, allowing the system to segment the scintillator function across different energy ranges and imaging modes.
Solution Approach 2:
The invention transitions from a single-layer scintillator design to a multi-layer stacked architecture, adding the dimension of layer depth. This enables different layers to specialize in different functions (resolution vs. absorption) and allows the system to access multiple imaging modes by selecting which layers to activate.
2Loss of energy
If the scintillator is made thicker to absorb more X-ray photons for high contrast imaging, then X-ray absorption increases, but spatial resolution deteriorates due to increased lateral light diffusion
Solution Approach 1:
The scintillator is segmented into multiple discrete layers (first scintillator layer and second scintillator layer) with different thicknesses. The first layer is thinner for high-resolution imaging, while the second layer is thicker for high-absorption imaging, allowing the system to segment the scintillator function across different energy ranges and imaging modes.
Solution Approach 2:
Different regions (layers) of the scintillator are given different local qualities - the first layer has thinner thickness optimized for resolution, while the second layer has greater thickness optimized for absorption. Each layer's properties are locally optimized for its specific function rather than using a uniform thickness throughout.
3Adaptability or versatility
If dual energy acquisition is implemented using dual source or fast kVp switching, then dual energy imaging capability is achieved, but system complexity increases
Solution Approach 1:
The detector system achieves multi-functionality by incorporating multiple scintillator layers that can operate independently or in combination. The same detector hardware can perform low-energy imaging, high-energy imaging, and dual-energy imaging by selectively activating different layers, eliminating the need for separate dual-source systems or fast kVp switching mechanisms.
Solution Approach 2:
Instead of using a complex dual-source system, the invention creates a simplified copy approach by stacking multiple scintillator layers that replicate the dual-energy detection capability in a single stationary detector, replacing the need for multiple X-ray sources or rapid switching mechanisms.
4Device complexity
If a single scintillator layer is used for both low-energy and high-energy imaging, then device simplicity is maintained, but imaging performance compromises occur
Solution Approach 1:
The scintillator is segmented into multiple discrete layers (first scintillator layer and second scintillator layer) with different thicknesses. The first layer is thinner for high-resolution imaging, while the second layer is thicker for high-absorption imaging, allowing the system to segment the scintillator function across different energy ranges and imaging modes.
Solution Approach 2:
The invention transitions from a single-layer scintillator design to a multi-layer stacked architecture, adding the dimension of layer depth. This enables different layers to specialize in different functions (resolution vs. absorption) and allows the system to access multiple imaging modes by selecting which layers to activate.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system provides high-resolution 2D imaging, dual energy imaging, and high-contrast 3D imaging, enhancing quantum efficiency and spectral performance, while allowing for faster read-out times without compromising spatial resolution.
Implementation Method 1
a first scintillator... configured to emit a burst of scintillation photons responsive to a low-energy radiation quantum being absorbed by the first scintillator layer
Implementation Method 2
a second scintillator... configured to emit a burst of scintillation photons responsive to a high-energy radiation quantum being absorbed by the second scintillator layer
Implementation Method 3
a first photosensor layer attached to a front side of the first scintillator layer opposite the second scintillator layer, said first photosensor layer configured to detect scintillation photons generated in the first scintillator layer
Implementation Method 4
a second photosensor layer attached to a back side of the second scintillator layer, said second photosensor layer configured to detect scintillation photons generated in the second scintillator layer
Data Source
Figure 1~3f
Figure 4
Figure 5
AI summary
The present invention relates to a system for X-ray imaging. It is explained to position (210) an X-ray detector (10) relative to an X-ray source such that at least a part of a region between the X-ray source and the X-ray detector is an examination region for accommodating an object. The X-ray source and X-ray detector are controlled (220) by a processing unit in order to: operate (230) in a first imaging operation mode; or operate (240) in a second imaging operation mode; or operate (250) in the first imaging mode and in the second imaging mode; or operate (260) in a third imaging operation mode. The detector comprises a first scintillator (20), a second scintillator (30), a first sensor array (40), and a second sensor array (50). The first sensor array is associated with the first scintillator. The first sensor array comprises an array of sensor elements configured to detect optical photons generated in the first scintillator. The second sensor array is associated with the second scintillator. The second sensor array comprises an array of sensor elements configured to detect optical photons generated in the second scintillator. The first scintillator is disposed over the second scintillator such that X-rays emitted from the X-ray source first encounter the first scintillator and then encounter the second scintillator. The first scintillator has a thickness equal to or greater than 0.6mm. The second scintillator has a thickness equal to or greater than 1.1mm. In the first imaging operation mode the first scintillator and the first sensor array are configured to provide data useable to generate a low energy X-ray image. In the second imaging operation mode the second scintillator and the second sensor array are configured to provide data useable to generate a high energy X-ray image. In the third imaging operation mode the first scintillator, the first sensor array, the second scintillator and the second sensor array are configured to provide data useable to generate a combined energy X-ray image.