Dual-Length Probe Structure for Mixed-Signal IC Testing
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Solution Overview
Problem
Existing probe devices cannot simultaneously perform high-frequency and digital signal testing on integrated circuit chips due to the use of probes of a single length, which is inadequate for both types of signal testing requirements.
Innovation Solution
A probe device with two distinct probe structures, one featuring shorter probes for high-frequency signal testing and another with longer probes for digital signal testing, allowing simultaneous contact with different contacts on the same object under test.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a probe device uses probes of a single length, then the device structure is simple, but it cannot simultaneously perform both high-frequency signal testing and digital signal testing
Solution Approach 1:
The probe device is divided into multiple probe structures (first probe structure with shorter probes for high-frequency signals, second probe structure with longer probes for digital signals). Each probe structure is independently designed to handle specific signal types, allowing the device to perform multiple testing functions simultaneously without excessive complexity.
Solution Approach 2:
Different regions of the probe device are assigned different probe lengths based on local testing requirements. The first probe structure with shorter probes is optimized for high-frequency signal contacts, while the second probe structure with longer probes is optimized for digital signal contacts. Each local region has probes with properties tailored to its specific function.
2Measurement precision
If a probe device uses shorter probes for high-frequency signal testing, then high-frequency testing is effective, but the probes cannot reach digital signal contacts that require longer probes
Solution Approach 1:
The probe device segments probes into two distinct groups: shorter probes for high-frequency signal contacts and longer probes for digital signal contacts. This segmentation ensures that each probe type can effectively reach its target contacts while maintaining the required measurement precision for its specific signal type.
Solution Approach 2:
Probe length is optimized locally according to the specific contact requirements. Shorter probes are positioned for high-frequency contacts where precision is critical, while longer probes are positioned for digital signal contacts where reachability is the primary requirement. Each local area has probe characteristics matched to its functional needs.
3Measurement precision
If a probe device uses longer probes for digital signal testing, then digital signal testing is effective, but the probes are unsuitable for high-frequency signal testing
Solution Approach 1:
The probe device segments probes into two distinct groups: longer probes for digital signal testing and shorter probes for high-frequency signal testing. This segmentation ensures that each probe type maintains its optimized characteristics for the specific signal type, preventing degradation of measurement precision and testing reliability for either function.
Solution Approach 2:
Probe length is optimized locally according to the specific contact requirements. Longer probes are positioned for digital signal contacts where reachability is critical, while shorter probes are positioned for high-frequency contacts where signal integrity is paramount. Each local area has probe characteristics matched to its functional needs, ensuring both precision and reliability.
Data Source
AI summary
The present disclosure provides a probe device. The probe device includes a first probe structure and a second probe structure. The first probe structure includes: a first body, a first substrate and a plurality of first probes. The first substrate is disposed on the first body. The first probes electrically connects to the first substrate and protrudes from a surface of the first substrate. The second probe structure includes: a second body, a second substrate and a plurality of second probes. The second body has a plurality of through holes. The second probes electrically connects to the second substrate and protrudes from a surface of the second body through the through holes. The length of the first probe is different from the length of the second probes.