Dual-Loop Overcurrent Protection Circuit for Full-Range Detection
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Solution Overview
Problem
Existing overcurrent protection methods are prone to measurement errors due to external factors like process variations and environmental changes, leading to increased complexity and cost in circuit design.
Innovation Solution
A dual-loop overcurrent protection circuit comprising a load switch, first and second mirror circuits, and a control circuit that generates node voltages within specific voltage regions, allowing for efficient overcurrent detection and protection by comparing these voltages with a reference voltage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a more complex and accurate measurement circuit is used to overcome weak measured signal, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The voltage range is segmented into multiple regions, with each mirror circuit responsible for detecting overcurrent in a specific voltage region. This segmentation allows each circuit to operate within an optimized range, improving measurement precision without requiring a single complex circuit to handle the entire voltage range.
Solution Approach 2:
Mirror circuits are introduced as intermediary components between the load switch and the control circuit. These mirror circuits amplify and condition the weak measured signals from the parasitic metal, making them easier to detect and process without requiring complex measurement circuitry.
2Device complexity
If traditional overcurrent protection method is used, then device complexity is reduced, but measurement precision deteriorates due to external factors
Solution Approach 1:
The invention changes the operating parameters of the mirror circuits based on the voltage region. Each mirror circuit is configured with specific parameters optimized for its designated voltage region, allowing accurate measurement across the entire voltage range while maintaining relatively simple circuit structures.
Solution Approach 2:
The control circuit dynamically selects which mirror circuit to use based on the current voltage region. This dynamic switching allows the system to maintain high measurement precision across varying operating conditions without requiring all mirror circuits to be active simultaneously, thus managing device complexity effectively.
3Reliability
If dual-loop overcurrent protection is implemented, then reliability is improved, but device complexity increases
Solution Approach 1:
The protection system is segmented into multiple independent mirror circuits, each handling a specific voltage region. This segmentation improves reliability by ensuring that a failure in one mirror circuit does not affect the others, while the overall device complexity is managed through the modular architecture.
Solution Approach 2:
Multiple mirror circuits provide redundant protection coverage, with each circuit capable of independently detecting overcurrent conditions in its designated voltage region. This partial redundancy improves reliability without requiring full duplication of the entire protection system, thus balancing reliability improvement with device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The dual-loop mechanism effectively improves overcurrent protection efficiency by covering the entire voltage range with a simple circuit architecture, reducing measurement errors and circuit complexity compared to traditional methods.
Implementation Method 1
The first mirror circuit is configured to generate a first node voltage in a state that a voltage difference between the two terminals of the load switch is within a first voltage region
Implementation Method 2
The second mirror circuit is configured to generate a second node voltage in a state that the voltage difference between the two terminals of the load switch is within a second voltage region
Implementation Method 3
The control circuit is configured to cut off the load switch according to at least one of the first node voltage and the second node voltage to perform an overcurrent protection
Data Source
AI summary
An overcurrent protection circuit, a memory storage device, and an overcurrent protection method are disclosed. The overcurrent protection circuit includes a load switch, a first mirror circuit, a second mirror circuit, and a control circuit. The first mirror circuit is configured to generate a first node voltage in a state that a voltage difference between two terminals of the load switch is within a first voltage region. The second mirror circuit is configured to generate a second node voltage in a state that the voltage difference between the two terminals of the load switch is within a second voltage region. The control circuit is configured to cut off the load switch according to at least one of the first node voltage and the second node voltage to perform an overcurrent protection. The first voltage region is different from the second voltage region.