Dual Measuring Device System for Process Control Calibration

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current analytical measuring devices face challenges in achieving high accuracy and low detection limits for monitoring measurands in process control, particularly in dynamic processes, due to cross-sensitivity issues and long measurement cycles, which can lead to inaccurate process control and reduced productivity in fields like biotechnological production.

Innovation Solution

A dual-measuring device system comprising an in-line sensing element for real-time monitoring and a near-line analyzer for sample-based analysis, where the in-line device provides rapid measurements and the near-line device offers high accuracy and low detection limits, with an electronic control system for verification, calibration, and adjustment to enhance measurement quality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If an in-line sensing element is used for real-time monitoring, then measurement speed and productivity are improved, but measurement precision and detection limits deteriorate due to cross-sensitivity issues

Engineering Contradiction:
Improvemeasurement speedVSAvoiddetection limit
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The measuring system is divided into two separate measuring devices: a first in-line measuring device for rapid real-time monitoring and a second near-line measuring device for high-precision reference measurements. This segmentation allows each device to be optimized for its specific function without compromise

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A sampling device acts as an intermediary between the process and the second measuring device, extracting samples for near-line analysis. This intermediary enables the second device to perform accurate measurements without being subject to the cross-sensitivity issues affecting in-line devices

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If a near-line analyzer is used for high accuracy measurements, then measurement precision is improved, but measurement speed and productivity deteriorate due to long measurement cycles

Engineering Contradiction:
ImproveaccuracyVSAvoidmeasurement speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The system segments measurement functions between two devices operating at different speeds and precision levels, allowing the fast device to handle real-time monitoring while the slow device provides periodic high-precision reference data

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The control device uses feedback from the second high-precision measuring device to verify and calibrate the first in-line measuring device. This feedback loop ensures the fast device maintains accuracy without requiring continuous slow measurements

Inventive Principle:
Principle #23Feedback

3Measurement precision

If dual-measuring device system is implemented, then measurement accuracy is improved, but device complexity increases

Engineering Contradiction:
ImproveaccuracyVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The control device performs multiple functions: it controls both measuring devices, processes data from both sources, performs verification and calibration operations, and manages the sampling device. This multi-functionality reduces overall system complexity despite having two measuring devices

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS11703494B2Measuring device
Publication Date: 2023.07.18 ENDRESS HAUSER CONDUCTA GMBH CO KG
  • US11703494B2 patent drawing
  • US11703494B2 patent drawing

AI summary

A measuring apparatus for determining at least one measurand of a measuring medium includes a first measuring device including a first measuring sensor structured to contact the measuring medium and configured to detect measured values of the at least one measurand, the first measuring device embodied to determine a first measured value that is dependent on the at least one measurand of the measuring medium, a sampling device structured to remove a sample from the measuring medium, a second measuring device including a second measuring sensor and embodied to determine a second measured value that is dependent on the least one measurand of the sample, and an electronic control apparatus configured to receive and process the first and second measured value and to perform a verification, calibration and/or adjustment of the first measuring device using the second measured value.