Dual-Mode Lighting Apparatus for 3D Surface Profile Reconstruction
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Solution Overview
Problem
Conventional 3D profiling apparatuses face complexity in assembly due to interdependent positional adjustments of lighting devices and reticles, leading to misalignment and uneven pattern formation on target surfaces.
Innovation Solution
A lighting apparatus with two modes of illumination, utilizing a grating and optical devices like beam-splitters to independently adjust the pattern and full-surface illumination, allowing for easier alignment and improved pattern consistency on target surfaces.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If conventional lighting devices and reticles are used with interdependent positional adjustments, then pattern alignment can be achieved, but device complexity and assembly difficulty increase significantly
Solution Approach 1:
The lighting apparatus is divided into two independent lighting devices: a first lighting device for projecting patterns through the reticle, and a second lighting device for illuminating the entire target surface. This segmentation allows each lighting device to be adjusted and positioned independently, eliminating the interdependent adjustments required in conventional single-lighting-device systems while maintaining pattern alignment precision.
Solution Approach 2:
A beam splitter is introduced as an intermediary optical component that separates the light paths from the two lighting devices. The beam splitter directs light from the first lighting device through the reticle to create the pattern, while simultaneously allowing light from the second lighting device to illuminate the entire target surface. This intermediary component enables independent control and adjustment of each lighting path without affecting the other.
2Device complexity
If reticle angle is constrained by light projection angle, then optical path can be simplified, but pattern uniformity deteriorates due to misalignment with object plane
Solution Approach 1:
The system allows dynamic adjustment of the reticle angle independently from the lighting device angles. The first lighting device can be positioned at an optimal angle for projecting the pattern, while the reticle can be rotated to align its surface normal with the object plane. This dynamic independence enables both optical path efficiency and pattern uniformity to be optimized simultaneously, eliminating the constraint present in conventional fixed-geometry systems.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Simplifies the assembly process by allowing independent adjustments of the grating and lighting devices, ensuring accurate and consistent 3D profile reconstruction with reduced fringe amplitude variations.
Implementation Method 1
a first lighting device arranged relative to the grating, so that the first lighting device is operable to project light onto the grating to thereby produce the pattern onto the target surface
Implementation Method 2
the grating is arranged between the optical device and the first lighting device so that light from the first lighting device that is projected onto the grating is reflected by the optical device to produce the grating pattern onto the target surface
Data Source
AI summary
Disclosed is an apparatus for reconstructing a three-dimensional profile of a target surface of an object. The apparatus comprises: i) a lighting apparatus having at least two modes of illumination to illuminate the target surface, wherein a first mode of illumination produces a pattern onto the target surface and a second mode of illumination illuminates every part of the target surface; ii) an imaging device for capturing respective images of the target surface upon a sequential activation of the first and second modes of illumination of the target surface by the lighting apparatus; and iii) a processor for reconstructing the three-dimensional profile of the target surface based on the images of the target surface as captured by the imaging device. A method of reconstructing a 3D profile of a target surface of an object is also disclosed.