Dual-Mode Optical Instrument for Nanoparticle Characterization
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Solution Overview
Problem
Current methods for characterizing nanoparticulate materials, such as proteins, lack the ability to provide both structural and size information simultaneously, with sophisticated instruments being expensive and not suitable for routine measurements or quality control.
Innovation Solution
An optical instrument that combines coherent light scattering for size information with Raman spectroscopy for molecular structural information, using a dual-mode system with a coherent light source, light intensity detector, and spectral light detector to measure both elastically and inelastically scattered light, allowing for the derivation of physical and chemical properties of samples.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of information
If sophisticated instruments such as X-ray crystallography and multidimensional NMR are used to obtain structural information about complex nanoparticulates, then substantial structural information is provided, but the cost increases to a million dollars or more and the instruments are not suitable for routine measurements or quality assurance
Solution Approach 1:
The patent combines Dynamic Light Scattering (DLS) and Raman spectroscopy into a single integrated instrument system. The DLS component provides particle size and size distribution information while the Raman spectroscopy component provides molecular structural information. By merging these two complementary techniques, the system delivers comprehensive characterization data that previously required multiple separate instruments, thereby reducing overall instrument cost and complexity while maintaining substantial structural information capability
Solution Approach 2:
The patent creates a multi-functional instrument that performs both DLS measurements for particle sizing and Raman spectroscopy for structural analysis. This universal platform can characterize various nanoparticulate materials including proteins, viral vectors, and liposomes using a single instrument, eliminating the need for expensive specialized instruments like X-ray crystallography or multidimensional NMR while still providing comprehensive structural and size information suitable for routine measurements and quality assurance
2Measurement precision
If instruments such as Dynamic Light Scattering (DLS) or Size Exclusion Chromatography (SEC) are used to obtain size information about nanomaterials, then higher resolution size information is provided, but the ability to deliver structural or shape information is lost
Solution Approach 1:
The patent merges DLS technology for precise particle sizing with Raman spectroscopy for structural characterization. The DLS module maintains its high-resolution size measurement capability while the added Raman module provides complementary structural and conformational information. This combination allows simultaneous acquisition of both size distribution data and molecular structural data from the same sample, eliminating the trade-off between size precision and structural information
3Loss of information
If instruments such as Circular Dichroism (CD), Raman spectroscopy, or Fourier Transform Infrared (FTIR) spectroscopy are used to obtain molecular structural and conformational information, then structural information is provided, but the ability to provide direct information about size or size distribution is lost
Solution Approach 1:
The patent combines Raman spectroscopy for structural analysis with DLS for particle size measurement in a single integrated system. The Raman spectroscopy component provides detailed molecular structural and conformational information while the DLS component simultaneously provides accurate particle size and size distribution data. This merged system eliminates the limitation of standalone spectroscopic instruments by adding direct size measurement capability without compromising structural information quality
Data Source
AI summary
The invention relates to methods and apparatus for detecting properties of suspended particles. Embodiments disclosed include an optical instrument (200) for detecting properties of a sample, comprising: a sample cell (103) for holding a sample of a particulate dispersion; a coherent light source (101) configured to illuminate the sample in the sample cell (103); a light intensity detector (104, 106) positioned to receive and measure an intensity of light from the coherent light source (101) elastically scattered by the sample in the sample cell (103); and a spectral light detector (212) positioned and configured to receive and measure a range of wavelengths of light from the coherent radiation source (101) inelastically scattered by the sample in the sample cell (103).