Dual-Mode Shift Register for High-Frequency Clock-Masking Signal Examination
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Solution Overview
Problem
Current methods for examining high-frequency clock-masking signal patterns at full speed are either cost-prohibitive due to the need for high-bandwidth laboratory setups or require extensive additional hardware, such as numerous serial shift registers, which consume power and area.
Innovation Solution
A system and method utilizing dual-mode shift registers to load and shift bits in parallel and serial modes, allowing for the examination of high-frequency clock-masking signal patterns at a reduced frequency, thereby enabling observation within a standard laboratory bandwidth without excessive hardware.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high-frequency clock-masking signal patterns are examined at full speed using conventional methods, then measurement accuracy is maintained, but device complexity and cost increase due to requiring high-bandwidth laboratory setups
Solution Approach 1:
The examination process is segmented into two distinct phases: a parallel loading phase where code patterns are loaded into the shift register at high frequency, and a serial output phase where the loaded patterns are examined at reduced frequency. This segmentation allows the system to maintain measurement accuracy during the critical examination phase while reducing the bandwidth requirements for the laboratory setup during that phase.
Solution Approach 2:
The code patterns are preliminarily loaded into the shift register in parallel mode at high frequency before the examination process begins. By pre-loading the patterns during a brief high-speed phase, the system prepares the data in advance so that the subsequent examination can proceed at reduced frequency without losing measurement accuracy.
2Measurement precision
If numerous serial shift registers are used to store output data for examination, then measurement capability is improved, but hardware area and power consumption increase
Solution Approach 1:
The shift register is designed to perform multiple functions: it serves as both a parallel input register for loading code patterns and a serial output register for examining those patterns. By making the same hardware structure multi-functional, the system eliminates the need for separate dedicated storage registers, thereby reducing hardware area while maintaining full pattern examination capability.
Solution Approach 2:
The shift register dynamically switches between parallel mode and serial mode based on the operational phase. During the loading phase, it operates in parallel mode to accept high-frequency input; during the examination phase, it switches to serial mode to output patterns at reduced frequency. This dynamic reconfiguration allows a single register to replace what would otherwise require multiple static registers.
3Measurement precision
If numerous serial shift registers are used to store output data, then measurement capability is improved, but power consumption increases
Solution Approach 1:
The single shift register is designed to perform both parallel loading and serial examination functions, eliminating the need for multiple dedicated storage registers. Since fewer registers are required, the total power consumption of the register bank is reduced while maintaining full pattern examination capability.
4Productivity
If code patterns are loaded and examined in parallel mode only, then loading speed is improved, but examination capability at reduced frequency is lost
Solution Approach 1:
The shift register dynamically switches between parallel mode for high-speed loading and serial mode for reduced-frequency examination. This dynamic reconfiguration enables the system to optimize for loading speed when needed while maintaining the adaptability to examine patterns at different frequencies, thereby achieving both high productivity and frequency flexibility.
Solution Approach 2:
The operational sequence is segmented into distinct parallel loading phases and serial examination phases. During parallel phases, the system maximizes loading speed; during serial phases, it enables examination at reduced frequencies. This temporal segmentation allows the system to achieve both high loading speed and frequency adaptability without compromise.
Data Source
AI summary
The present invention provides for a method for examining high-frequency clock-masking signal patterns at a reduced frequency. A first mode of a first shift register is selected. A plurality of bits is loaded on the first shift register at a first frequency. A second mode of the first shift register is selected. A first mode of a second shift register is selected. The plurality of bits is loaded on the second shift register. A second mode of the second shift register is selected. A first mode of a third shift register is selected. The plurality of bits is loaded on the third shift register. A second mode of the third shift register is selected and the plurality of bits is loaded from the third shift register at a second frequency, where the second frequency is lower than the first frequency, thereby providing for examining high-frequency clock-masking signal patterns at a reduced frequency.