Dual-Mode X-Ray Beam System for Flexible Scattering Analysis
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Solution Overview
Problem
Current x-ray scattering and diffraction systems require separate instruments for one-dimensional and two-dimensional capabilities, leading to increased costs and reduced throughput, as they are designed for specific applications and cannot efficiently switch between modes.
Innovation Solution
A dual-mode x-ray scattering or diffraction system is developed, incorporating a source, optic, beam selection device, and detector that can produce one-dimensional, two-dimensional, and divergent beams, allowing for flexible operation modes by adjusting the beam selection mechanism and sample handling systems, enabling both modes with a single instrument.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate instruments are used for one-dimensional and two-dimensional x-ray capabilities, then each instrument can be optimized for its specific application, but the overall system cost increases and throughput decreases
Solution Approach 1:
The patent implements a universal x-ray instrument capable of operating in multiple modes (one-dimensional mode with line focus and two-dimensional mode with point focus) by using a single x-ray source with adjustable focal characteristics and a configurable optical path, eliminating the need for separate dedicated instruments for each application type
2Reliability
If separate instruments are used for one-dimensional and two-dimensional x-ray capabilities, then each instrument can be optimized for its specific application, but the system cost increases
Solution Approach 1:
The patent implements a universal x-ray instrument capable of operating in multiple modes (one-dimensional mode with line focus and two-dimensional mode with point focus) by using a single x-ray source with adjustable focal characteristics and a configurable optical path, eliminating the need for separate dedicated instruments for each application type
3Productivity
If a single instrument supports both one-dimensional and two-dimensional modes, then throughput increases and costs reduce, but the device complexity increases
Solution Approach 1:
The patent employs dynamic configurability where the x-ray source focal characteristics can be adjusted between line focus and point focus modes, and the optical path can be reconfigured using movable components such as slits and mirrors, allowing the system to adapt its complexity level based on the required operation mode
4Adaptability or versatility
If beam parameters are adjusted for different operation modes, then versatility improves, but alignment precision requirements increase
Solution Approach 1:
The patent employs precision mechanical adjustment mechanisms with feedback control systems that use detectors to monitor and verify beam alignment and optical path configuration, replacing purely manual alignment procedures with automated measurement and adjustment systems that ensure consistent precision across different operation modes
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This system enhances throughput and reduces costs by allowing high flux in one-dimensional mode and two-dimensional capability, offering higher signal-to-noise ratios and efficient sample handling, while maintaining alignment and data coordinate consistency across modes.
Implementation Method 1
A system for analyzing a sample through x-ray coherent scattering and diffraction
Implementation Method 2
incorporating a source, optic, beam selection device, and detector that can produce one-dimensional, two-dimensional, and divergent beams
Implementation Method 3
analyzing a sample through x-ray coherent scattering and diffraction
Implementation Method 4
analyzing a sample through x-ray coherent scattering and diffraction
Data Source
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Figure 3A
AI summary
A system for analyzing a sample is provided. The system includes an optical system capable of providing a one-dimensional beam and a two-dimensional beam. The system may include a beam selection device to select between providing a one- dimensional x-ray beam to the sample in a one-dimensional operation mode and a two- dimensional x-ray beam to the sample in a two-dimensional operation mode.