Dual-Model Product Recognition for New Defect Detection

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Solution Overview

Problem

Existing quality inspection methods struggle with inaccurate recognition of new defect types due to the difficulty in collecting defect samples and the inability of traditional models to generalize beyond trained defect types, leading to low accuracy in identifying defective products.

Innovation Solution

A dual recognition approach using a first model for defect recognition and a second model for qualification recognition, with iterative training based on feedback from the second model to enhance the first model's accuracy, incorporating unsupervised learning to improve recognition of new defect types.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional single-model defect recognition is used, then the recognition speed is fast, but the accuracy for new defect types is low

Engineering Contradiction:
Improverecognition accuracyVSAvoidmodel complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent divides the recognition system into two separate models: a defect recognition model and a qualification recognition model. Each model specializes in one aspect, allowing them to achieve high accuracy in their respective domains without the complexity of a single comprehensive model. The defect recognition model focuses on identifying defective products, while the qualification recognition model focuses on identifying qualified products, resolving the contradiction between accuracy and complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent combines the outputs of two separate recognition models to make the final quality determination. By merging the defect recognition result and qualification recognition result, the system achieves comprehensive accuracy for both known and new defect types while maintaining the simplicity of individual specialized models.

Inventive Principle:
Principle #5Merging (Combining)

2Adaptability or versatility

If dual recognition model is used, then the accuracy for new defect types is improved, but the computational complexity increases

Engineering Contradiction:
Improvegeneralization capabilityVSAvoidcomputational resource consumption
Core Design Contradiction:
Adaptability or versatilityVSUse of energy by moving object

Solution Approach 1:

The patent segments the recognition task into two specialized models with distinct functions. The defect recognition model handles known defect patterns, while the qualification recognition model handles overall product quality assessment. This segmentation allows each model to be optimized for its specific task, improving generalization capability while controlling computational resources through focused processing.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies partial action by using the qualification recognition model only when needed to resolve ambiguous cases or identify new defect types. For clear-cut cases, the system relies on the defect recognition model alone, thus reducing overall computational resource consumption while maintaining high adaptability for new defect scenarios.

Inventive Principle:
Principle #16Partial or excessive action

3Reliability

If iterative training with feedback is implemented, then the model robustness is enhanced, but the training time increases

Engineering Contradiction:
Improvemodel robustnessVSAvoidtraining time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent implements feedback mechanisms where the qualification recognition model's results are used to refine and retrain the defect recognition model. This feedback loop continuously improves model robustness by incorporating real-world performance data, allowing the system to adapt to new defect types while managing training time through iterative rather than exhaustive retraining cycles.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent employs periodic action by implementing feedback-based retraining at scheduled intervals or when performance degradation is detected, rather than continuous retraining. This approach enhances model robustness through regular updates while minimizing training time loss by avoiding constant retraining, thus resolving the contradiction between reliability and time efficiency.

Inventive Principle:
Principle #19Periodic action

Data Source

PatentUS12524863B2Product recognition method, model training method, device and electronic device
Publication Date: 2026.01.13 BEIJING BAIDU NETCOM SCI & TECH CO LTD
  • US12524863B2 patent drawing
  • US12524863B2 patent drawing
  • US12524863B2 patent drawing

AI summary

A product recognition method and device, a model training method and device, and an electronic device are provided. The product recognition method includes: obtaining image data of a product; performing defect recognition on the image data based on a first recognition model, to obtain a first recognition result, wherein the first recognition model is configured to recognize a defective product; performing qualification recognition on the image data based on a second recognition model to obtain a second recognition result, wherein the second recognition model is configured to recognize a qualified product; determining a target recognition result of the product based on the first recognition result and the second recognition result.