Dual-Model Product Recognition for New Defect Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing quality inspection methods struggle with inaccurate recognition of new defect types due to the difficulty in collecting defect samples and the inability of traditional models to generalize beyond trained defect types, leading to low accuracy in identifying defective products.
Innovation Solution
A dual recognition approach using a first model for defect recognition and a second model for qualification recognition, with iterative training based on feedback from the second model to enhance the first model's accuracy, incorporating unsupervised learning to improve recognition of new defect types.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional single-model defect recognition is used, then the recognition speed is fast, but the accuracy for new defect types is low
Solution Approach 1:
The patent divides the recognition system into two separate models: a defect recognition model and a qualification recognition model. Each model specializes in one aspect, allowing them to achieve high accuracy in their respective domains without the complexity of a single comprehensive model. The defect recognition model focuses on identifying defective products, while the qualification recognition model focuses on identifying qualified products, resolving the contradiction between accuracy and complexity.
Solution Approach 2:
The patent combines the outputs of two separate recognition models to make the final quality determination. By merging the defect recognition result and qualification recognition result, the system achieves comprehensive accuracy for both known and new defect types while maintaining the simplicity of individual specialized models.
2Adaptability or versatility
If dual recognition model is used, then the accuracy for new defect types is improved, but the computational complexity increases
Solution Approach 1:
The patent segments the recognition task into two specialized models with distinct functions. The defect recognition model handles known defect patterns, while the qualification recognition model handles overall product quality assessment. This segmentation allows each model to be optimized for its specific task, improving generalization capability while controlling computational resources through focused processing.
Solution Approach 2:
The patent applies partial action by using the qualification recognition model only when needed to resolve ambiguous cases or identify new defect types. For clear-cut cases, the system relies on the defect recognition model alone, thus reducing overall computational resource consumption while maintaining high adaptability for new defect scenarios.
3Reliability
If iterative training with feedback is implemented, then the model robustness is enhanced, but the training time increases
Solution Approach 1:
The patent implements feedback mechanisms where the qualification recognition model's results are used to refine and retrain the defect recognition model. This feedback loop continuously improves model robustness by incorporating real-world performance data, allowing the system to adapt to new defect types while managing training time through iterative rather than exhaustive retraining cycles.
Solution Approach 2:
The patent employs periodic action by implementing feedback-based retraining at scheduled intervals or when performance degradation is detected, rather than continuous retraining. This approach enhances model robustness through regular updates while minimizing training time loss by avoiding constant retraining, thus resolving the contradiction between reliability and time efficiency.
Data Source
AI summary
A product recognition method and device, a model training method and device, and an electronic device are provided. The product recognition method includes: obtaining image data of a product; performing defect recognition on the image data based on a first recognition model, to obtain a first recognition result, wherein the first recognition model is configured to recognize a defective product; performing qualification recognition on the image data based on a second recognition model to obtain a second recognition result, wherein the second recognition model is configured to recognize a qualified product; determining a target recognition result of the product based on the first recognition result and the second recognition result.


