Dual Optical Detector Microscopy for Rapid Multi-Sample Imaging
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Solution Overview
Problem
Current microscopy techniques require extensive time and effort to examine multiple samples due to the need for manual repositioning and focusing, especially when samples are in microtiter plates or petri dishes, limiting the number of samples that can be analyzed before properties become unidentifiable.
Innovation Solution
A device with a first optical detector that moves consecutively to multiple measuring positions to capture initial image data with a lower spatial resolution, while a second optical detector tracks the first to capture higher-resolution images of specific regions identified by an image data analyzer, reducing the time needed for detailed examinations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single optical detector is used to examine multiple samples with high resolution, then detailed imaging quality is improved, but examination time increases significantly
Solution Approach 1:
The patent divides the imaging task into two segments: a first optical detector captures low-resolution overview images to identify samples of interest, while a second optical detector captures high-resolution detailed images only of those identified samples. This segmentation allows the system to maintain high measurement precision for critical samples while dramatically reducing total examination time by avoiding high-resolution imaging of all samples.
2Productivity
If multiple optical detectors are used to examine multiple samples simultaneously, then productivity is improved, but device complexity increases
Solution Approach 1:
The patent merges the functions of multiple detectors into a coordinated two-detector system where the first detector screens multiple samples and the second detector details identified samples. This combining approach achieves the productivity benefits of multiple simultaneous examinations while managing complexity through functional integration and sequential operation rather than requiring fully independent parallel systems.
3Measurement precision
If high-resolution imaging is performed on all samples, then measurement precision is improved, but time consumption increases
Solution Approach 1:
The system performs preliminary low-resolution imaging with the first optical detector to identify samples of interest before applying high-resolution imaging with the second optical detector. This preliminary action filters out samples that do not require detailed examination, ensuring that high measurement precision is applied only where necessary and significantly reducing overall time consumption.
4Loss of time
If samples are examined quickly, then loss of time is reduced, but measurement precision may deteriorate
Solution Approach 1:
The patent applies different quality levels of imaging to different samples based on their importance: low-resolution imaging for routine screening of all samples and high-resolution imaging for detailed examination of identified samples of interest. This local quality approach ensures that measurement precision is optimized for critical samples while maintaining efficient throughput for the overall sample population.
Data Source
AI summary
The present invention relates to a device and a method for microscopy (100) of a plurality of samples (102), wherein the device comprises:—a first optical detector (106, 108), which is designed to consecutively adopt a plurality of measuring positions and to detect first image data (200) of a sample (104) with a first spatial resolution at each measuring position;—an image data analyser device which is designed to determine for each sample (202) a region (204) of the sample to be examined represented within the first image data (200) in each case;—a second optical detector (110, 112), which is coupled to the first optical detector (106, 108) in such a manner that the second optical detector (110, 112) tracks the first optical detector (106, 108) and therefore the second optical detector (110, 112) adopts measuring positions which the first optical detector (106, 108) had previously adopted. The second optical detector (110, 112) is designed to detect for each sample (202) respective second image data (300) from the region (204) to be examined in the sample (202) concerned, with a spatial resolution that is higher than the first spatial resolution.