Dual-Output ADC Architecture for Faster Sensor Test Processing
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Solution Overview
Problem
Conventional noise shaping type successive approximation analog-to-digital converters (AD converters) experience increased latency during digital conversion processes, which prolongs test processing time in sensor systems, making it challenging to determine if a sensor system is in an abnormal state efficiently.
Innovation Solution
The AD converter is designed with a dual output system, where the second digital data with lower resolution is output to a test controller before the higher resolution first digital data, allowing for reduced latency in test processing. This is achieved by using a cascade configuration of a successive approximation type AD converter and a ΔΣ type AD converter, with the latter's output filtered to generate high-resolution data, while the former generates low-latency data used for testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a noise shaping type successive approximation AD converter is used to increase output data resolution, then measurement precision is improved, but the conversion time increases causing longer test processing time
Solution Approach 1:
The patent divides the single AD conversion process into two separate conversion paths: a first AD converter for high-resolution conversion and a second AD converter for low-latency conversion. This segmentation allows the system to obtain both high precision and fast response by processing the same analog signal through different conversion mechanisms simultaneously, thereby resolving the contradiction between measurement precision and test processing time.
2Measurement precision
If digital filter processing is applied to increase resolution, then measurement precision is improved, but the processing latency increases
Solution Approach 1:
The patent creates a copy of the analog signal path, routing the signal to both a first AD converter (which undergoes digital filter processing for high resolution) and a second AD converter (which provides rapid conversion without extensive filtering). The second converter's output serves as a low-latency copy for test purposes, eliminating the need to wait for the high-resolution conversion and filtering process to complete.
Data Source
AI summary
Provided are an analog-to-digital (AD) converter, a sensor system, and a test system capable of reducing the time for test processing. AD converter includes input part, AD conversion part, first output part, and second output part. The analog signal output from sensor is input to input part. AD conversion part digitally converts an analog signal to generate first digital data and second digital data. First output part outputs the first digital data to control circuit. Second output part outputs the second digital data to test controller before first output part outputs the first digital data. In the test mode, test controller determines whether or not sensor system including sensor is in an abnormal state on the basis of the second digital data.