Dual-Pad Probe Contact Structure for Reliable Electrical Testing
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Solution Overview
Problem
Traditional probe structures in semiconductor testing face limitations due to small probe sizes, high manufacturing costs, and inadequate contact force, leading to inefficiencies and material waste when individual contacts fail.
Innovation Solution
The electrical detection method incorporates a wiring structure with electrical detection pads and auxiliary pads, allowing probes to apply force to both simultaneously, enhancing contact force and reducing material waste by enabling continued functionality when individual pads fail.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Force
If a single contact pad is used for electrical detection, then the probe structure is simple, but the contact force is insufficient
Solution Approach 1:
The contact pad is divided into two separate pads: an electrical detection pad for signal testing and an electrical auxiliary pad for providing contact force. This segmentation allows each pad to serve its specific function independently, resolving the contradiction between sufficient contact force and structural simplicity.
Solution Approach 2:
The electrical auxiliary pad acts as an intermediary element that provides mechanical support and contact force to the probe, while the electrical detection pad handles the electrical testing function. This intermediary structure enables the probe to achieve adequate contact force without complicating the electrical detection mechanism.
2Ease of manufacture
If traditional probe structures are used, then manufacturing costs are high, but the probe size is limited
Solution Approach 1:
The invention transitions from a single-contact-point probe structure to a multi-contact-point structure by engaging both the electrical detection pad and electrical auxiliary pad. This dimensional change in the contact interface allows for better force distribution and reduces manufacturing complexity without limiting probe size.
3Loss of substance
If a single contact pad is used, then the probe structure is simple, but material waste occurs when contact fails
Solution Approach 1:
The electrical auxiliary pad serves as a recoverable element that can continue to provide mechanical support even when the electrical detection pad fails. This allows the substrate to be rescued and reused, significantly reducing material waste while maintaining the relative simplicity of the contact pad structure.
Solution Approach 2:
The electrical auxiliary pad provides beforehand cushioning by being pre-positioned to support the probe mechanically. This ensures that even if the electrical detection pad fails, the structural integrity and contact capability are maintained, preventing total failure and material waste.
4Reliability
If probes contact only a single contact pad, then the detection process is simple, but contact reliability is insufficient
Solution Approach 1:
The detection process is segmented into two distinct contact points: one for electrical detection and one for auxiliary support. This segmentation improves contact reliability by distributing the mechanical and electrical functions across separate pads, while the overall detection process remains straightforward.
Data Source
AI summary
An electrical detection method provides a wiring structure including a base material body and a plurality of contact portions bonded to the base material body. Each of the contact portions includes an electrical detection pad exposed from a surface of the base material body, an electrical auxiliary pad exposed from the surface of the base material body, and a conductor that electrically connects the electrical detection pad and the electrical auxiliary pad. When probes of a detection device are connected to the contact portions, each of the probes exerts a force on the electrical detection pad and the electrical auxiliary pad of each of the contact portions at the same time, so that the contact force between the probes and the contact portions is enhanced to facilitate the electrical testing.