Material Level Measurement via Dual-Path Signal Reflection
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Solution Overview
Problem
Material level measuring apparatuses, such as time domain reflection radar sensors, face inaccuracies due to various factors like material permittivity, leading to inconvenient and unreliable measurements.
Innovation Solution
A method involving a material level measuring apparatus that transmits electromagnetic waves, calculates time-passing differences to determine material levels, and uses multiple signals to improve accuracy by averaging and selecting the least error-prone data for display.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If a material level measuring apparatus uses electromagnetic wave transmission to measure material level, then the measurement can be performed non-contactly and continuously, but the measurement accuracy deteriorates due to factors like material permittivity variations
Solution Approach 1:
The patent divides the measurement process into multiple independent measurement paths: (1) electromagnetic wave reflection from material surface, (2) electromagnetic wave transmission through material to container bottom and reflection back. Each path provides an independent measurement result that can be compared and validated, thereby improving overall measurement accuracy while maintaining non-contact operation
Solution Approach 2:
The system incorporates a feedback mechanism where the control unit receives measurement results from multiple paths, compares them against predetermined reference values, and automatically determines the accurate material level. This feedback loop compensates for permittivity variations by selecting measurements that match expected patterns, thus resolving the accuracy issue while preserving continuous non-contact monitoring
2Device complexity
If the material level measuring apparatus relies on a single measurement method, then the device complexity is reduced, but the measurement accuracy and reliability deteriorate due to permittivity variations
Solution Approach 1:
The patent merges multiple measurement methods within a single apparatus: combining reflection-based measurement (from material surface) with transmission-based measurement (through material to container bottom). The control unit integrates results from both methods, using predetermined reference values to validate and select accurate measurements. This merging approach improves precision while maintaining relatively simple device structure through shared hardware components
3Reliability
If multiple measurement methods are used to improve accuracy, then measurement reliability is improved, but the device complexity and calculation requirements increase
Solution Approach 1:
The control unit acts as an intermediary that manages the complexity of multiple measurement methods. It receives signals from both reflection and transmission paths, compares them against predetermined reference values, and automatically selects the accurate measurement result. This intermediary function consolidates the complexity into a single decision-making component, improving reliability while keeping the overall system manageable through automated reference-based validation
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the accuracy of material level measurements by using multiple signal reflections and averaging methods to reduce errors, providing more reliable data for users.
Implementation Method 1
The material level measuring apparatus transmits an electromagnetic wave signal along a surface of the probe toward the material
Implementation Method 2
When the electromagnetic wave signal touches a surface of the material, a first reflected signal is generated. When the electromagnetic wave signal touches a bottom of the probe, a second reflected signal is generated
Data Source
AI summary
A probe (14) of a material level measuring apparatus (10) inserts into a container (20). The material level measuring apparatus (10) transmits an electromagnetic wave signal. When the electromagnetic wave signal touches a surface of a material (30), a first reflected signal is generated. When the electromagnetic wave signal touches a bottom of the probe (14), a second reflected signal is generated. According to the first reflected signal and the second reflected signal, a first time-passing difference value (t1) and a second time-passing difference value (t2) are obtained. According to the first time-passing difference value (t1), the second time-passing difference value (t2) and a predetermined empty container time-passing difference value (t3), a first material level and a second material level are obtained. According to the first material level and the second material level, a third material level is obtained.