Dual-Path Particle Characterization Apparatus for Size and Shape Analysis
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Solution Overview
Problem
Existing particle characterization instruments face challenges in accurately measuring larger particles while maintaining a compact size and high measurement quality, as they struggle to separate scattered light from illumination light effectively, leading to increased costs and limitations in detecting aggregates and contaminants.
Innovation Solution
A particle characterization apparatus using a combination of a first light source for scattering measurements and a second imaging light source, with detectors configured to operate at angles to each other, allowing for simultaneous scattering and imaging measurements to improve the detection of particle size and shape, and correct for the presence of larger particles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single light source and detector arrangement is used for light diffraction measurements, then the instrument can be kept compact, but the ability to accurately separate scattered light from illumination light deteriorates, leading to reduced measurement quality
Solution Approach 1:
The patent divides the measurement system into two independent optical paths: a first light source with first detector for light diffraction measurements, and a second light source with second detector for imaging measurements. This segmentation allows each subsystem to be optimized independently - the imaging system can use longer focal lengths and different detector arrangements to separate light paths without compromising the compactness required for scattering measurements.
Solution Approach 2:
The patent combines two previously separate measurement capabilities (light diffraction and imaging) into a single integrated instrument. By merging these functions while maintaining separate optical paths, the instrument achieves both accurate particle size distribution measurement and improved detection of larger particles, while the combined system remains more compact than separate instruments would be.
2Measurement precision
If detectors are positioned close to the focused spot of the illumination beam to separate scattered light, then measurement accuracy improves, but alignment requirements become more stringent and device complexity increases
Solution Approach 1:
The patent separates the optical paths by using two independent light sources and detectors positioned at different locations. The first detector is positioned to receive scattered light at specific angles, while the second detector is positioned for imaging measurements. This spatial segmentation reduces the alignment sensitivity required for each individual detector position.
Solution Approach 2:
The patent introduces a second light source as an intermediary that provides a separate illumination path for imaging measurements. This intermediary light source allows the imaging detector to be positioned without requiring precise alignment with the scattering detector, as each has its own independent illumination and detection path.
3Measurement precision
If a longer focal length is used to allow illumination beam and scattered light to separate, then light separation improves, but the instrument size increases and stability problems arise
Solution Approach 1:
The patent segments the optical system into two independent paths with different focal lengths. The first path uses a shorter focal length optimized for scattering measurements, while the second path uses a longer focal length optimized for imaging. This allows the imaging function to benefit from longer focal length separation without requiring the entire instrument to be elongated.
Solution Approach 2:
The patent resolves the length constraint by utilizing the angular dimension differently. Instead of requiring a longer physical path for separation, the system uses angular positioning of detectors at specific scattering angles combined with the second light source for imaging, achieving separation in a different dimensional space.
4Measurement precision
If the lower size limit for light diffraction is reached where scattering becomes isotropic, then fine particle detection improves, but the ability to distinguish particle sizes deteriorates
Solution Approach 1:
The patent merges light diffraction measurement with imaging measurement capabilities. While light diffraction provides particle size distribution information, the imaging system provides direct visual confirmation and additional size information for larger particles. This combination compensates for the information loss in the isotropic scattering regime by using a different measurement principle.
Solution Approach 2:
The patent creates a multi-functional instrument that can operate in both light diffraction mode for particle size distribution and imaging mode for direct particle visualization. This universality allows the system to handle the full range of particle sizes, from fine particles measured by diffraction to larger particles measured by imaging, without losing size differentiation capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the accuracy and reliability of particle size distribution measurements by correlating data from both detectors, enabling the detection of larger particles and improving the fidelity of measurements, while reducing the need for complex and costly components.
Implementation Method 1
illuminating the sample and measuring the light scattered by the particles
Implementation Method 2
the second detector is an imaging detector, configured to image the particles along an imaging axis using the second light beam
Data Source
AI summary
A particle characterization apparatus is disclosed comprising: a first light source; a second light source, a sample cell; a first detector and a second detector. The first light source is operable to illuminate a first region of a sample comprising dispersed particles within the sample cell with a first light beam along a first light beam axis so as to produce scattered light by interactions of the first light beam with the sample. The first detector is configured to detect the scattered light. The second light source is operable to illuminate a second region of the sample with a second light beam along a second light beam axis. The second detector is an imaging detector, configured to image the particles along an imaging axis using the second light beam. The first light beam axis is at an angle of at least 5 degrees to the second light beam axis.