Dual Probe Contact Verification for IC Pad Testing

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Solution Overview

Problem

Current electrical testers face challenges in reliably determining the quality of probe pin and pad contact, especially in simultaneous engagement scenarios, leading to increased test time, risk of probe damage, and poor quality test data due to wear-and-tear issues and positional errors in probe alignment.

Innovation Solution

A testing apparatus comprising a pair of probe pins and an indicator circuit that outputs a signal when both pins are in simultaneous electrical engagement with a terminal pad, utilizing secondary probe pins and contact indicators like piezoelectric buzzers, LED lights, ohmmeters, or voltmeters to confirm contact quality in real-time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If current electrical testers are used for probe pin and pad contact testing, then testing can be performed, but test time increases and probe damage risk increases due to wear-and-tear issues and positional errors

Engineering Contradiction:

Improvecontact quality determinationVSAvoidtest time

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The system performs preliminary contact verification by detecting simultaneous engagement of multiple probe pins with terminal pads before proceeding with full testing. This preliminary action identifies contact quality issues early, preventing wasted test time on faulty connections and reducing probe damage risk from repeated failed contact attempts.

Inventive Principle:

Principle #10Preliminary action

2Reliability

If current electrical testers are used for probe pin and pad contact testing, then testing can be performed, but probe damage risk increases due to wear-and-tear issues and positional errors

Engineering Contradiction:

Improvecontact quality determinationVSAvoidprobe durability

Core Design Contradiction:

ReliabilityVSStrength

Solution Approach 1:

Inventive Principle:

Principle #10Preliminary action

3Productivity

If simultaneous engagement of multiple probe pins is tested without contact verification, then testing efficiency is maintained, but contact quality accuracy deteriorates

Engineering Contradiction:

Improvetesting efficiencyVSAvoidcontact quality determination

Core Design Contradiction:

ProductivityVSMeasurement precision

Solution Approach 1:

The system provides real-time feedback by detecting whether multiple probe pins are simultaneously engaged with terminal pads. This feedback mechanism allows the testing system to immediately identify contact quality issues, enabling accurate contact quality determination while maintaining testing efficiency through automated detection rather than manual verification.

Inventive Principle:

Principle #23Feedback

Data Source

PatentUS12188961B2Method for accurate pad contact testing

Publication Date: 2025.01.07 INTERNATIONAL BUSINESS MACHINE CORPORATION

AI summary

A testing apparatus and a method for testing an integrated circuit are described. One embodiment of the testing apparatus may comprise a main probe pin configured for electrical testing of a sample, the sample having a terminal pad, and a secondary probe pin configured for contact testing of the main probe pin against the terminal pad. In some embodiments, the testing apparatus may further comprise an indicator circuit electrically connected to the main probe pin and the secondary probe pin. The indicator circuit may output a signal when the main probe pin and the secondary probe pin are in simultaneous electrical engagement with the terminal pad.