Dual-Ramp ADC Comparator Layout for Image Sensor Linearity

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Solution Overview

Problem

Existing dual ramp analog-to-digital converters for image sensors suffer from column-to-column fixed pattern noise and nonlinearity due to signal-dependent input offset voltage in the comparator, leading to suboptimal performance.

Innovation Solution

Applying the analog signal and coarse ramp to the same input of a comparator, with a fine ramp applied to the opposite input, and using a second comparator to compensate for switch feedthrough, thereby reducing nonlinear input offset errors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If the analog signal and coarse ramp are applied to different inputs of the comparator, then the conversion process is simpler, but signal-dependent input offset voltage causes column-to-column fixed pattern noise and nonlinearity

Engineering Contradiction:
Improvecomparator configuration complexityVSAvoidconversion linearity
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent inverts the conventional approach by applying the analog signal and coarse ramp to the same comparator input, rather than different inputs. This inversion eliminates the signal-dependent input offset voltage that causes nonlinearity, as the offset becomes independent of the input signal amplitude. The fine ramp is applied to the opposite input to complete the dual-ramp comparison process.

Inventive Principle:
Principle #13The other way round (Inversion)

2Device complexity

If a single comparator is used for dual ramp conversion, then the device complexity is reduced, but switch feedthrough effects increase nonlinear input offset errors

Engineering Contradiction:
Improvecomparator quantityVSAvoidinput offset error
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent segments the comparison function into two separate comparators: a first comparator that handles the coarse ramp comparison with the analog signal, and a second comparator that handles the fine ramp comparison. This segmentation isolates the switch feedthrough effects to specific stages, allowing each comparator to operate with reduced nonlinear offset errors while maintaining overall system simplicity.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS7804438B2Image sensors and dual ramp analog-to-digital converters and methods
Publication Date: 2010.09.28 ALEXANDER KRYMSKI D B A ALEXIMA
  • US7804438B2 patent drawing
  • US7804438B2 patent drawing
  • US7804438B2 patent drawing

AI summary

Dual ramp analog-to-digital converters and methods allow for performing analog-to-digital conversion of an analog signal. Various dual ramp analog-to-digital converters and methods allow for applying the analog signal and a coarse ramp to a same input of a comparator, and applying a fine ramp to another input of the comparator. Some dual ramp analog-to-digital converters and methods allow for applying the analog signal, a coarse ramp, and a fine ramp to a same input of a comparator. Various dual ramp analog-to-digital converters and methods allow for applying the analog signal to an input of a first comparator, applying a coarse ramp to the input of the first comparator through a coarse ramp switch, applying the analog signal to an input of a second comparator, and applying a fine ramp to another input of the second comparator.