Multimodal Microscope Dual-SLM Illumination for Background Reduction
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Solution Overview
Problem
Existing microscopes face challenges in generating high-quality, flexible illumination modes due to inaccuracies in spatial light modulator setups, leading to inefficient use of excitation light and unwanted background intensity.
Innovation Solution
A multimodal microscope design with a controller that controls a second spatial light modulator outside the illumination region to represent a grating with a chosen period, ensuring diffraction orders lie outside the sample path, combined with a high-pass filter to remove unwanted light, and a relay optical unit for enhanced flexibility and accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If a spatial light modulator is arranged in a pupil plane for beam shaping, then illumination patterns can be generated, but inaccuracies in the setup lead to unwanted background intensity and inefficient light usage
Solution Approach 1:
A second spatial light modulator is introduced as an intermediary component in the intermediate image plane to correct and refine the illumination pattern generated by the first spatial light modulator in the pupil plane. This intermediary SLM compensates for setup inaccuracies and eliminates unwanted background intensity while maintaining the desired illumination patterns.
2Manufacturing precision
If multiple spatial light modulators are added to improve illumination quality, then pattern accuracy increases, but device complexity increases
Solution Approach 1:
The second spatial light modulator performs multiple functions: it corrects setup inaccuracies from the first SLM, eliminates unwanted background intensity, and enables seamless switching between different illumination modes. This multi-functionality justifies the additional component by resolving multiple issues simultaneously.
3Illumination intensity
If excitation light is concentrated at a focus point for high intensity, then sample illumination intensity increases, but scanning time increases for larger regions
Solution Approach 1:
The illumination beam is segmented into multiple independent spots using spatial light modulators, allowing parallel illumination of multiple sample regions simultaneously. This segmentation enables high intensity illumination across the entire sample area without the time penalty of sequential scanning, as all spots are illuminated at once.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enhances illumination pattern accuracy, reduces unwanted background intensity, and allows seamless switching between different illumination modes without increased complexity, optimizing light usage and image quality.
Implementation Method 1
Spatial light modulators (SLM=Spatial Light Modulator) encompass devices which can vary a phase and/or an amplitude of incident light in a location-dependent manner in the beam cross section
Implementation Method 2
the controller is configured to control the second spatial light modulator outside a desired illumination region for the purpose of representing a grating, the period of which is chosen such that excitation light of the +1st and/or of the −1st order of diffraction lies in at least one pupil plane outside a region through which there is propagation as far as the sample
Implementation Method 3
combined with a high-pass filter to remove unwanted light
Data Source
AI summary
A multimodal microscope having a light source for transmitting excitation light, an illumination beam path with a microscope objective for guiding the excitation light onto and/or into a sample a first spatial light modulator arranged in or near a pupil plane of the illumination beam path and a second spatial light modulator arranged in or near an intermediate image plane of the illumination beam path downstream of the pupil plane, a controller at least configured to control the first and/or the second spatial light modulator for realizing an illumination mode for the sample. The controller is configured to control the second spatial light modulator outside a desired illumination region for representing a grating, the period of which is chosen such that excitation light of the +1st and/or −1st order of diffraction lies in at least one pupil plane outside a region through which there is propagation as far as the sample.