Dual Spectral Sensor Layout for Background Noise Correction

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Solution Overview

Problem

Conventional spectroscopy systems fail to consider background noise in spectral measurements, which can be due to fluctuations or changes in the environment surrounding or otherwise associated with the sample under analysis.

Innovation Solution

A device and method that utilizes a first and second spectral sensor oriented toward the measurement object to measure both the sample and background noise simultaneously, with the sample and background noise simultaneously, and a processing unit to apply corrections to the spectral measurement data based on background measurement data.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional spectroscopy systems are used, then the analysis speed and minimal sample preparation are maintained, but the measurement precision deteriorates due to uncorrected background noise

Engineering Contradiction:
Improvespectral measurement precisionVSAvoidspectral sensing arrangement complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The spectral sensing arrangement is segmented into multiple spectral sensors, each dedicated to measuring specific wavelength ranges. This segmentation allows simultaneous measurement of both sample signal and background noise across different spectral bands, improving measurement precision while managing device complexity through functional specialization

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A reference spectral sensor is introduced as an intermediary element that measures background noise and environmental fluctuations. This intermediary sensor provides correction data that compensates for noise in the sample measurement, effectively improving measurement precision without requiring changes to the fundamental spectroscopy system architecture

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If background noise measurement is added, then the measurement precision improves, but the device complexity increases due to additional spectral sensors

Engineering Contradiction:
Improvenoise correction capabilityVSAvoidnumber of spectral sensors
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The additional spectral sensors are designed with multi-functionality, serving both as sample measurement sensors and background noise sensors depending on operational mode. This universality allows the system to improve measurement precision through noise correction while minimizing the increase in device complexity, as the same hardware components perform multiple functions

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The sample measurement and background noise measurement functions are merged into a unified spectral sensing arrangement that operates simultaneously. By combining these functions into a coordinated system rather than separate independent systems, the patent improves measurement precision while controlling device complexity through integrated operation

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively reduces noise in spectral measurements by using a dual-sensor system to measure and correct for background noise, enhancing the accuracy and reliability of spectral analysis.

Implementation Method 1

an illumination arrangement including at least one illumination source for illuminating the measurement area with illumination

Methodology Applied
Scientific EffectLight emission from illumination source: Light

Implementation Method 2

a first spectral sensor configured to perform a spectral measurement of the sample in response to the incident illumination so as to produce spectral measurement data

Methodology Applied
Scientific EffectPhotoelectric detection: Photoelectric Effect

Data Source

PatentUS20250389644A1Devices, Systems, and Methods for Analyzing Measurement Objects
Publication Date: 2025.12.25 AIKEMY GMBH
  • US20250389644A1 patent drawing
  • US20250389644A1 patent drawing
  • US20250389644A1 patent drawing

AI summary

A device for analyzing a sample includes a measurement area at which the sample is to be located, an illumination arrangement, and first and second spectral sensors. The illumination arrangement illuminates the measurement area such that the illumination is incident on the sample. Each of the first and second spectral sensors is oriented toward the measurement area to collect illumination arriving from the measurement area. The first spectral sensor performs a spectral measurement of the sample in response to the incident illumination so as to produce spectral measurement data. The second spectral sensor measures background noise so as to produce background measurement data that provides at least a partial correction for noise in the spectral measurement data. In certain embodiments, operation of the first and second spectral sensors is switched such that the second spectral sensor performs a spectral measurement and the first spectral sensor measures background noise.