Dual-Structure 3D Optical Target for Single-Exposure Positioning

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Solution Overview

Problem

Current optical measurement techniques for relative positioning between a tool-holder and a work-holder in machine tools are limited to two-dimensional measurements, which are not comprehensive enough to ensure accurate positioning, leading to increased costs and errors due to the need for additional measurement techniques and adjustments to account for wear and thermal drifts.

Innovation Solution

A three-dimensional target with a dual structure, featuring a planar reference face and an inclined face with specific reflective surfaces, allows for simultaneous optical registration in three dimensions using a single exposure step, independent of tool wear and thermal variations, by utilizing a combination of diffuse and specular reflection elements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If two-dimensional measurement techniques are used for relative positioning, then the measurement process is simpler, but the positioning accuracy and comprehensiveness are insufficient

Engineering Contradiction:
Improvepositioning accuracyVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent transitions from two-dimensional measurement to three-dimensional measurement by introducing a dual-structure target with a planar reference face and an inclined reference face. The inclined face at a known angle (e.g., 45 degrees) enables depth measurement along the Z-axis by capturing its projection in the X-Y plane, thereby achieving comprehensive 3D positioning without requiring separate measurement systems for each dimension.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent combines multiple measurement functions into a single optical capture system. By merging the measurement of X-Y coordinates (via the planar reference face) and Z-depth information (via the inclined reference face projection) into one simultaneous capture process, the system achieves comprehensive 3D positioning without requiring multiple separate measurement devices or sequential measurement steps.

Inventive Principle:
Principle #5Merging (Combining)

2Reliability

If multiple measurement techniques are used to account for wear and thermal drifts, then the measurement accuracy is improved, but the measurement time and costs increase

Engineering Contradiction:
Improvemeasurement reliabilityVSAvoidmeasurement time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent merges multiple measurement capabilities into a single simultaneous capture operation. The dual-structure target allows the optical system to capture both the planar reference face (for X-Y positioning) and the inclined reference face (for Z-depth and wear compensation) in one exposure, eliminating the need for sequential measurements and reducing measurement time while maintaining reliability.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The target structure is pre-configured with known geometric relationships (the inclined face at a specific angle to the planar face). This preliminary design enables the system to compensate for wear and thermal drift through geometric analysis of a single capture, rather than requiring multiple adjustment steps or recalibrations during operation.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If separate measurement systems are used for different dimensions, then each dimension can be measured accurately, but the overall system complexity and cost increase

Engineering Contradiction:
Improvedimensional measurement precisionVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The dual-structure target serves multiple measurement functions simultaneously: the planar reference face provides X-Y positioning information, while the inclined reference face provides Z-depth information through its projection. This universal target design enables a single optical system to perform what would otherwise require separate measurement devices for each dimension, reducing overall system complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The inclined reference face is designed to project depth information (Z-dimension) onto the X-Y plane, allowing a single 2D camera capture to encode 3D spatial information. This dimensional transformation enables one optical system to measure all three dimensions without requiring additional specialized sensors or devices.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables accurate three-dimensional relative positioning between the tool-holder and work-holder with high precision and speed, reducing measurement time and costs by eliminating the need for multiple measurement steps and adjustments, while maintaining accuracy across varying conditions.

Implementation Method 1

a first portion whose surface is reflective according to a diffuse reflection

Methodology Applied
Scientific EffectDiffuse reflection: Reflection

Implementation Method 2

a second portion whose surface is reflective according to a specular reflection

Methodology Applied
Scientific EffectSpecular reflection: Reflection

Data Source

PatentUS11549801B2Three-dimensional target with a dual structure, device and method for optical measurement with such a target
Publication Date: 2023.01.10 WATCHOUTCORP SA
  • US11549801B2 patent drawing
  • US11549801B2 patent drawing
  • US11549801B2 patent drawing

AI summary

A three-dimensional target capable of serving as a positioning reference, including, on a useful face, a first structure and a second structure. The first structure defines a planar reference face divided up between at least a first portion whose surface is reflective according to a diffuse reflection, and a second portion whose surface is reflective according to a specular reflection, the second portion being divided up according to a series of localized zones positioned in the first portion. The second structure has an inclined face relative to the planar reference face. Applicable to three-dimensional optical measurement of the relative position between a first object and a second object.