Dual-Surface Wiring for Floating-Body Multi-Gate Transistors

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Solution Overview

Problem

Current semiconductor apparatus designs limit the density and design flexibility of signal lines and power supply lines, as they are typically formed on either the upper or lower surface of the transistor element layer, restricting the formation of contacts and increasing parasitic resistance.

Innovation Solution

The semiconductor apparatus features a dual-layer wiring structure with the first wiring layer on one surface and the second wiring layer on the other, allowing for enhanced signal line density and design freedom, with both layers capable of forming contacts to transistors, thereby improving connectivity and reducing parasitic resistance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If signal lines and power supply lines are formed on a single surface of the transistor element layer, then the structure is simpler, but the line density and design flexibility are limited

Engineering Contradiction:
Improvewiring structure complexityVSAvoidsignal line density
Core Design Contradiction:
Device complexityVSQuantity of substance

Solution Approach 1:

The patent transitions from a two-dimensional single-surface wiring layout to a three-dimensional dual-surface wiring architecture. By utilizing both the upper and lower surfaces of the transistor element layer for wiring formation, the available wiring space is effectively doubled, thereby increasing signal line density and design flexibility without proportionally increasing structural complexity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Ease of manufacture

If contacts are formed only from one surface, then the manufacturing process is simpler, but parasitic resistance increases

Engineering Contradiction:
Improvecontact formation process simplicityVSAvoidparasitic resistance
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The contact formation process is segmented into two independent pathways: one from the upper surface and one from the lower surface. This segmentation allows each contact path to be optimized independently and enables parallel processing during manufacturing, while simultaneously reducing the length and resistance of each individual contact path by utilizing the shorter distance from the nearest surface

Inventive Principle:
Principle #1Segmentation

3Quantity of substance

If power supply wirings are embedded in the transistor element layer, then the wiring density is improved, but the manufacturing precision requirements increase

Engineering Contradiction:
Improvewiring densityVSAvoidembedding precision
Core Design Contradiction:
Quantity of substanceVSManufacturing precision

Solution Approach 1:

Instead of embedding all wirings within the transistor element layer, the patent utilizes the third dimension by extending wiring formation to both upper and lower surfaces. This dimensional expansion allows power supply wirings to be distributed across multiple layers and surfaces, reducing the density requirement within any single embedded layer while maintaining overall high wiring density through spatial distribution

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS20240234308A9Semiconductor apparatus and method for manufacturing semiconductor apparatus
Publication Date: 2024.07.11 ADVANTEST CORP
  • US20240234308A9 patent drawing
  • US20240234308A9 patent drawing
  • US20240234308A9 patent drawing

AI summary

To provide a semiconductor apparatus including a transistor element layer having a plurality of transistors which are multi-gate transistors of a floating body structure, a first wiring layer having at least one signal line which electrically connects between a source and a gate or between a drain and a gate of at least one pair of transistors among the plurality of transistors, the first wiring layer being laminated on the side of one surface of the transistor element layer, and a second wiring layer having at least one signal line which electrically connects between a source and a gate or between a drain and a gate of at least another pair of transistors among the plurality of transistors, the second wiring layer being laminated on the side of another surface of the transistor element layer.