Dual-Wavelength Optical Alignment for Subsurface Imaging

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Solution Overview

Problem

Current optical signal acquisition and processing methods, such as OCT, face challenges in effectively visualizing subsurfaces of target materials, particularly in medical and industrial applications, where precise alignment and imaging of light signals across different spectral regions are required to detect abnormalities or faults.

Innovation Solution

A medical device and method utilizing a dual light source system with a first light source operating in a specific region for visualization and a second light source in a near-infrared region for subsurface imaging, where the focal points of both light signals are aligned and adjusted to project an identifying mark on the target surface, enabling the detection of abnormalities or faults through image processing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single light source is used for imaging, then the device complexity is reduced, but the ability to visualize subsurfaces at different depths with optimal contrast is compromised

Engineering Contradiction:
Improvelight source configurationVSAvoidsubsurface imaging precision
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The imaging system divides the light source into multiple segments, each emitting at different wavelengths optimized for specific imaging depths. The first light source emits visible light for surface visualization, while the second light source emits near-infrared light for subsurface imaging, allowing each segment to perform its specialized function without interference

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system changes the wavelength parameter of the light source to optimize imaging at different depths. By using visible light (shorter wavelength) for surface imaging and near-infrared light (longer wavelength) for subsurface imaging, the system adapts the light parameters to match the specific requirements of each imaging depth, improving overall measurement precision

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If multiple light sources with different focal points are used, then surface and subsurface imaging are optimized, but the alignment complexity increases

Engineering Contradiction:
Improveimaging resolutionVSAvoidoptical alignment system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

An optical component acts as an intermediary between the two light sources with different focal points. This component receives light from both sources and redirects them along a common optical path, effectively mediating the alignment issue by providing a unified pathway that maintains the distinct focal characteristics of each light source while enabling coordinated imaging

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system merges the optical paths of two separate light sources into a single coaxial path. By combining the visible light path and near-infrared light path through a shared optical trajectory, the system reduces the number of separate alignment requirements while maintaining the ability to independently focus each light source at its optimal depth

Inventive Principle:
Principle #5Merging (Combining)

3Length of stationary object

If near-infrared light is used for subsurface penetration, then the imaging depth is improved, but the visibility of the light signal to the operator is reduced

Engineering Contradiction:
Improveimaging depthVSAvoidlight signal visibility
Core Design Contradiction:
Length of stationary objectVSIllumination intensity

Solution Approach 1:

The imaging function is segmented into two distinct light sources: one for surface visualization with visible light and another for subsurface penetration with near-infrared light. This segmentation allows each light source to operate in its optimal wavelength range without compromise

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The imaging system is designed with multi-functionality, where the first light source provides both surface illumination and visible feedback to the operator, while the second light source provides subsurface penetration capability. The system as a whole performs both surface and subsurface imaging functions, compensating for the limited visibility of individual near-infrared light

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for precise visualization and detection of subsurface abnormalities or faults in both biological and non-biological materials, providing enhanced diagnostic capabilities in medical applications and industrial inspections.

Implementation Method 1

a first light source for emitting a first light signal operating in a first region of the light spectrum that enables visualization of a target surface

Methodology Applied
Scientific EffectLight emission: Light

Implementation Method 2

a second light source for emitting a second light signal operating in a second region of the light spectrum that enables a reflection of a portion of the second light signal from at least one subsurface of the target material

Methodology Applied
Scientific EffectNear-infrared light emission and penetration: Infrared Radiation

Implementation Method 3

The scattered infrared light reflected from the target material can be used to generate micrometer resolution of three or two-dimensional images

Methodology Applied
Scientific EffectLight scattering: Scattering

Implementation Method 4

a first optical device providing a coaxial optical path of the first light signal and the second light signal and providing a first focal point of the first light signal to be in at least a proximate location of a second focal point of the second light signal

Methodology Applied
Scientific EffectLight focusing: Focusing

Data Source

PatentUS9014792B2Method and apparatus for analyzing subsurfaces of a target material
Publication Date: 2015.04.21 WELCH ALLYN INC
  • US9014792B2 patent drawing
  • US9014792B2 patent drawing
  • US9014792B2 patent drawing

AI summary

A system that incorporates teachings of the present disclosure may include, for example, a method for aligning first and second light signals on an optical path directed to a target, where the first light signal provides a visualization of the target, and a portion of the second light signal reflects from at least one subsurface of the target. The method also includes aligning a first focal point of the first light signal and a second focal point of the second light signal, where the first focal point is at least in a first proximate location of the second focal point, and adjusting a first position of the first and second focal points to be in at least a second proximate location of the target without adjusting the at least first proximate location of the first focal point relative to the second focal point. Other embodiments are disclosed.