Dual-Window Laser Deflection Optics With Variable Focus Scanning
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Laser-based additive manufacturing processes face challenges in maintaining accuracy and efficiency due to process deviations, which can lead to time-consuming post-processing or remanufacturing, and require online quality control and process regulation to rectify errors promptly.
Innovation Solution
A deflection unit with a focusing device having adjustable focal length and an optical element that allows for decoupled control of the working and detection beams, enabling flexible focal adjustments and improved process monitoring without interfering with the laser work process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a fixed focal length lens is used in the deflection unit, then the device complexity is reduced, but the manufacturing precision and adaptability deteriorate due to inability to compensate for focal plane deviations during scanning
Solution Approach 1:
The patent applies the dynamics principle by implementing a focusing device with variable focal length that can be dynamically adjusted during the laser scanning process. The focal length is changed as a function of the deflection angle to compensate for focal plane deviations, transforming a static optical system into a dynamic one that adapts to scanning conditions and maintains processing precision.
2Device complexity
If the working beam and detection beam paths are coupled, then the device complexity is reduced, but the measurement precision deteriorates due to interference from the high-power laser beam
Solution Approach 1:
The patent applies segmentation by spatially separating the working beam path and detection beam path into distinct regions. The detection beam path is positioned in a region where it does not overlap with the high-power working laser beam, thereby eliminating mutual interference. This segmentation allows independent optimization of each beam path for its specific function while maintaining overall system compactness.
3Reliability
If process monitoring is added to the deflection unit, then the reliability is improved, but the device complexity increases due to additional optical components
Solution Approach 1:
The patent applies merging by integrating the process monitoring function directly into the existing deflection unit structure. The detection device and its optical components are combined with the working beam deflection system, allowing simultaneous laser processing and real-time quality monitoring through a unified optical platform, thereby improving reliability without proportionally increasing overall system complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enhances process monitoring and control, ensuring more precise and reliable laser processing by allowing independent adjustment of focal positions and sizes, thereby improving accuracy and reducing errors in additive manufacturing.
Implementation Method 1
an optical element that at least partially reflects a first wavelength and that optionally also at least partially transmits at least another second wavelength
Implementation Method 2
a focusing device for focusing the working beam, wherein the focusing device has a variable focal length
Implementation Method 3
an XY deflection device to deflect the working beam in order to scan an emitted working beam
Data Source
Figure 1
Figure 2
Figure 3~4
AI summary
The present invention relates to a deflection unit (10) having an optical element (20), which partly reflects a first wavelength and which partly transmits a different, second wavelength. The deflection unit defines an operating beam path traversed by the operating beam (14) from a first window (12) to a second window (24) via a reflection at the optical element (20). The deflection unit comprises an XY-deflection device (22), which is arranged in the operating beam path in order to scan the operating beam that has emerged, a focusing device (16) for focusing the operating beam (14), wherein the focusing device has a variable focal length and is arranged in the operating beam path between the first window (12) and the optical element (20).